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Comparison Between the SNS and SIS Josephson Voltage Standards at OFMET

Published

Author(s)

Blaise Jeanneret, Alain Rufenacht, Charles J. Burroughs

Abstract

Recently, a new Josephson voltage standard based on a lV programmable chip provided by the National Institute of Standards and Technology (NIST) was impemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson voltage standard showed an agreement of 1.4 1 3.4 parts in 1010 at 1V. This result demonstrates the new system is functioning properly and can be used in various types of measurements. In particular, it will be one of the key component of the Watt balance experiment [1] that is presently under construction at OFMET.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
50
Issue
2

Keywords

Josephson, SNS, voltage standards

Citation

Jeanneret, B. , Rufenacht, A. and Burroughs, C. (2001), Comparison Between the SNS and SIS Josephson Voltage Standards at OFMET, IEEE Transactions on Instrumentation and Measurement (Accessed April 19, 2024)
Created March 31, 2001, Updated October 12, 2021