Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements

Published

July 1, 1999

Author(s)

Marvin E. Cage, Anne-Marie Jeffery

Abstract

We analyze the effects of the large capacitances-to-shields existing in all sample probes on measurements of the ac quantized Hall resistance R_H. The object of this analysis is to investigate how these capacitances affect the observed frequency dependence of R_H. Our goal is to see if there is some way to eliminate or minimize this significant frequency dependence, and thereby realize an intrinsic ac quantized Hall resistance standard. Equivalent electrical circuits are used in this analysis, with circuit components consisting of: capacitances and leakage resistances to the sample probe shields; inductances and resistances of the sample probe leads; quantized Hall resistances, longitudinal resistances, and voltage generators within the quantum Hall effect device; and multiple connections to the device. We derive exact algebraic equations for the measured R_H values expressed in terms of the circuit components. Only two circuits (with single-series offset and quadruple-series connections) appear to meet our desired goals of measuring both R_H and the longitudinal resistance R_x in the same cool-down for both ac and dc currents with an uncertainty of 10^-8R_H or less. These two circuits will be further considered in a future paper in which the effects of wire-to-wire capacitances are also included in the analysis.

Citation

Journal of Research (NIST JRES) -

Volume

104

Issue

4

NIST Pub Series

Journal of Research (NIST JRES)

Pub Type

NIST Pubs

Download Paper

Local Download

Keywords

ac quantum Hall effect, capacitance-to-shield, equivalent electrical circuit, longitudinal resistance, multi-series connections, quantized Hall resistance

Citation

Cage, M. and Jeffery, A. (1999), Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29384 (Accessed October 14, 2024)