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Comparison of Microwave and Mutual Inductance Measurements of the Inductive Nonlinearity of HTS Thin Films

Published

Author(s)

John H. Claassen, James Booth, James A. Beall, Leila R. Vale, David A. Rudman, Ronald H. Ono
Citation
Superconductor Science and Technology
Volume
2

Citation

Claassen, J. , Booth, J. , Beall, J. , Vale, L. , Rudman, D. and Ono, R. (1999), Comparison of Microwave and Mutual Inductance Measurements of the Inductive Nonlinearity of HTS Thin Films, Superconductor Science and Technology (Accessed July 12, 2024)

Issues

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Created September 30, 1999, Updated October 12, 2021