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Comparison Between the SNS and SIS Josephson Voltage Standards at NIST

Published

Author(s)

Blaise Jeanneret, Alain Rufenacht, Charles J. Burroughs
Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Issue
22
Conference Dates
May 14-19, 2000
Conference Location
Sydney, 1, AS

Citation

Jeanneret, B. , Rufenacht, A. and Burroughs, C. (2000), Comparison Between the SNS and SIS Josephson Voltage Standards at NIST, Proc., Conference on Precision Electromagnetic Measurements (CPEM), Sydney, 1, AS (Accessed May 26, 2024)

Issues

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Created April 30, 2000, Updated October 12, 2021