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Search Publications by: Thomas Mitchell Wallis (Fed)

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Displaying 26 - 50 of 158

Chapter 12 Depth profiling

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
Microwave tomography is an active, developing research area. The objective is to visualize hidden, subsurface features through application of microwave radiation. Applications include ground penetrating radars (GPR) [1], defect spectroscopy in materials

Chapter 13. Dynamics of nanoscale magnetic systems

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The topic of nanoscale magnetic systems is broad and could easily provide enough material for an entire book on its own. In this chapter, as in previous ones, we will focus on the nanoscale magnetic systems for which near-field scanning microwave

Chapter 6. Characterization of nanofiber devices

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
Previous chapters have introduced and described a variety of measurement techniques for RF nanoelectronic devices. Here, our objective is to work through an illustrative example that highlights strategies and challenges related to implementing a specific

Chapter 7. Probe-based measurement systems

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
In the preceding chapters, we have focused on broadband, calibrated measurements of nanoelectronic devices. In particular, we have described measurement techniques for the measurement of calibrated, complex scattering parameters and the subsequent

Chapter 8. Instrumentation for near-field scanning microwave microscopy

September 17, 2017
Author(s)
Pavel Kabos, Thomas Mitchell (Mitch) Wallis
In the previous chapter, we discussed the underlying physics and theory of operation for near-field scanning microwave microscopes (NSMMs) and related probe-based measurement systems. Here, we consider the practical implementations of such scanning probe

Chapter 9. Radio frequency scanning probe measurements of materials

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
Preceding chapters have described the near field scanning microwave microscope (NSMM), while discussing both the underlying theory of operation and practical considerations for instrumentation. A primary application area for NSMMs and related microscopes

Chapter 1. An introduction to radio frequency nanoelectronics

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The field of radio frequency (RF) nanoelectronics focuses on the fundamental study and engineering of devices that are enabled by nanotechnology and operate within a frequency range from about 100 MHz to about 100 GHz. This range includes frequencies

Chapter 2. Core concepts of microwave and RF measurements

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
In this chapter we will review the core concepts of microwave and radio frequency (RF) propagation in both guided-wave and on-wafer environments. Because most of these concepts are well-known, we will introduce only the terms and definitions that are

Chapter 3. Extreme Impedance Measurements

September 15, 2017
Author(s)
Pavel Kabos, Thomas Mitchell (Mitch) Wallis
Microwave measurements of RF nanoelectronic devices present numerous challenges. Among these, perhaps the most difficult measurement challenge arises from the inherent, often extreme impedance mismatch between nanolectronic systems and conventional

Chapter 4. On-wafer measurements of RF nanoelectronic devices

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The preceding chapters have introduced the core concepts and techniques of microwave measurements, in general, and techniques for microwave measurements of extreme impedance devices, in particular. Here, we narrow the focus further to on-wafer, microwave

Chapter 5. Modeling and validation of RF nanoelectronic devices

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The development and engineering of nanoelectronic devices has been characterized by several significant technological trends. In addition to the ongoing scaling of feature sizes down to nanoscale dimensions, the need for superior performance has driven the

Lithographic sonication patterning of large area nanopillar forests

July 27, 2017
Author(s)
Joel C. Weber, Matthew D. Brubaker, Thomas M. Wallis, Kristine A. Bertness
This paper demonstrates a highly-scalable, material-independent method for patterning nanopillar forests known as lithographic sonication patterning. Through contact lithography, patterns with dimensions down to 3 υm were written across a 3-inch silicon