Weber, J.
, Blanchard, P.
, Sanders, A.
, Imtiaz, A.
, Wallis, T.
, Coakley, K.
, Bertness, K.
, Kabos, P.
, Sanford, N.
and Bright, V.
(2014),
Gallium Nitride Nanowire Probe for Near-Field Scanning Microwave Microscopy, Applied Physics Letters, [online], https://doi.org/10.1063/1.4861862
(Accessed October 27, 2025)
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Gallium Nitride Nanowire Probe for Near-Field Scanning Microwave Microscopy
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Author(s)
, , , , , , , , , Victor M. Bright
Abstract
We report on the fabrication of a GaN nanowire probe for near-field scanning microwave microscopy. A single nanowire was Pt-bonded to a commercial Si cantilever prior to evaporation of a Ti/Al coating to provide a microwave signal pathway. Testing over a microcapacitor calibration sample shows the probe to have capacitance resolution of at least 0.7 fF with improved sensitivity and reduced uncertainty compared with a commercial microwave probe. High strength of the defect-free nanowire enabled it to maintain a tip radius of 150 nm after multiple contact-mode scans while demonstrating nanometer-scale topographical resolution.Citation
Applied Physics Letters
Volume
104
Issue
2
Pub Type
Journals
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Created January 15, 2014, Updated November 10, 2018