Vector-Network-Analyzer Calibration Using Line and Multiple Coplanar-Waveguide Offset Reflects

Published

December 9, 2016

Author(s)

Arkadiusz C. Lewandowski, Wojciech Wiatr, Dazhen Gu, Nate Orloff, Thomas Mitchell (Mitch) Wallis, Pavel Kabos

Abstract

We present the application of our newly developed multi-reflect-thru technique to vector-network-analyzer calibration in the on-wafer environment. This technique uses a set of highly-reflective one-port devices, referred to as offset-reflects, and a single transmission line sections. The offset reflects are constructed as transmission-line sections of different lengths terminated with the same highly-reflective load. Neither the propagation constant of the transmission-line sections, nor the load impedance need to be known, as they are determined along with the vector-network-analyzer calibration coefficients from the calibration standard measurements. We verify our approach by performing vector-network analyzer calibration in the 0.7-40 GHz frequency range with a set of offset-short and offset-open devices manufactured on a 0.5 mm thick quartz wafer, and comparing it with the classical multiline through-reflect-line calibration. The results we obtained agree well proving the validity of our approach

Citation

IEEE Microwave and Wireless Components Letters

Pub Type

Journals

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Keywords

vector network analyzer, calibration, multi-reflect-thru method, offset reflect, coplanar waveguide, nanowire, extreme impedances

Citation

Lewandowski, A. , Wiatr, W. , Gu, D. , Orloff, N. , Wallis, T. and Kabos, P. (2016), Vector-Network-Analyzer Calibration Using Line and Multiple Coplanar-Waveguide Offset Reflects, IEEE Microwave and Wireless Components Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=909577 (Accessed October 5, 2024)