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Near-Field Scaning Microwave Microscope (NSMM)

Published

Author(s)

Atif A. Imtiaz, Thomas M. Wallis, Pavel Kabos

Abstract

Electromagnetic waves in the microwave frequency range are an essential tool for the investigation of material and device properties across a broad range of applications. Examples of materials of interest include: ferroelectric materials, ferromagnetic materials, superconductors, semiconductors, graphene, carbon nanotubes, fullerenes, and life science materials, among others. These materials are studied in multiple scales, including bulk, thin film and ideally down to the scale of individual molecules. Examples of devices of interest include: electron charge- and spin-based nanoelectronics, bio-inspired devices, superconducting devices, and magneto-resistive devices, among many others.
Citation
McGraw Hill Encyclopedia for Science and Technology (2013)

Citation

Imtiaz, A. , Wallis, T. and Kabos, P. (2012), Near-Field Scaning Microwave Microscope (NSMM), McGraw Hill Encyclopedia for Science and Technology (2013), [online], https://doi.org/10.1036/1097-8542.YB130175 (Accessed June 22, 2024)

Issues

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Created December 30, 2012, Updated November 10, 2018