Imtiaz, A.
, Wallis, T.
and Kabos, P.
(2014),
Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology, IEEE Microwave Magazine, [online], https://doi.org/10.1109/MMM.2013.2288711
(Accessed December 12, 2024)
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Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology
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Abstract
On 29 December 1959 at the annual meeting of the American Physical Society, Richard Feynman gave a lecture at the California Institute of Technology titled "There Is Plenty of Room at the Bottom: An Invitation to Enter a New Field of Physics." This memorable lecture has since become very famous as it predicted and envisioned the current era of nanoscience and nanotechnology. The atomic level represents a totally new world of fresh opportunities for design and engineering due to the new physics available at such a small scale.Citation
IEEE Microwave Magazine
Volume
15
Issue
1
Pub Type
Journals
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Created January 1, 2014, Updated January 27, 2020