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Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology

Published

Author(s)

Atif A. Imtiaz, Thomas M. Wallis, Pavel Kabos

Abstract

On 29 December 1959 at the annual meeting of the American Physical Society, Richard Feynman gave a lecture at the California Institute of Technology titled "There Is Plenty of Room at the Bottom: An Invitation to Enter a New Field of Physics." This memorable lecture has since become very famous as it predicted and envisioned the current era of nanoscience and nanotechnology. The atomic level represents a totally new world of fresh opportunities for design and engineering due to the new physics available at such a small scale.
Citation
IEEE Microwave Magazine
Volume
15
Issue
1

Citation

Imtiaz, A. , Wallis, T. and Kabos, P. (2014), Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology, IEEE Microwave Magazine, [online], https://doi.org/10.1109/MMM.2013.2288711 (Accessed May 31, 2023)
Created January 1, 2014, Updated January 27, 2020