TY  - JOUR
AU  - Atif Imtiaz
AU  - Thomas Wallis
AU  - Pavel Kabos
C2  - IEEE Microwave Magazine
DA  - 2014-01-01
DO  - https://doi.org/10.1109/MMM.2013.2288711
LA  - en
M1  - 15
PB  - IEEE Microwave Magazine
PY  - 2014
TI  - Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology
ER  -