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Displaying 1101 - 1125 of 2289

Control of Protein Adsorption: Molecular Level Structural and Spatial Variables

October 27, 2004

Author(s)

David J. Vanderah, H La, Jessica Naff, Vitalii I. Silin, Kenneth A. Rubinson

Radiation Chemical Studies of Porphyrins and Metalloporphyrins

September 1, 2001

Author(s)

Pedatsur Neta

Radiation chemical studies of porphyrins and metalloporphyrins are reviewed.

Optical and Electrical Thickness Measurements of Alternate Gate Dielectrics: a Fundamental Difference

February 1, 2001

Author(s)

Curt A. Richter, Nhan Van Nguyen, Evgeni Gusev, T H. Zabel, G A. Alers

… gate dielectrics, ellipsometry, capacitance, effective oxide thickness …

Effects of Deposition Process Parameters on Exchange Coupling of A-Fe 2 O 3 /NiFe Bi-Layers and GMR in A-Fe 2 O 3 /NiFe/Cu/NiFe Spin Valves

September 1, 2000

Author(s)

S Bae, William F. Egelhoff Jr., P J. Chen, J Judy

… exchange coupling, giant magnetoresistance, iron oxide spin valves …

Structural Study of Ba 11 Fe 8 Ti 9 O 41 by X-Ray Diffraction

September 1, 2000

Author(s)

T Siegrist, C Svensson, Terrell A. Vanderah, Robert S. Roth

… Barium iron titanium oxide, crystal structure x-ray diffraction …

Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks

March 27, 2024

Author(s)

Md. Habibur Rahman, Prince Gollapalli, Panayotis Manganaris, Satyesh Kumar Yadav, Ghanshyam Pilania, Arun Kumar Mannodi-Kanakkithodi, Brian DeCost, Kamal Choudhary

… impurities in a chemical space of Group IV, III-V, and II-VI zinc blende (ZB) semiconductors, powered by crystal …

Aluminum oxide coatings on Co-rich cathodes and interactions with organic electrolyte

June 10, 2025

Author(s)

Michael Woodcox, M.D. Hashan Peiris, Diana Liepinya, Robert Shepard, Hao Liu, Manuel Smeu

… Aluminum oxide coatings on Co-rich cathodes and interactions with …

Tunable Noncollinear Antiferromagnetic Resistive Memory through Oxide Superlattice Design

April 27, 2018

Author(s)

Jason D. Hoffman, Stephen M. Wu, Brian Kirby, Anand Bhattacharya

… Noncollinear Antiferromagnetic Resistive Memory through Oxide Superlattice Design …

Oxidation behavior of iron nanoparticles in mixed matrix membranes for water purification

January 23, 2015

Author(s)

Jessica D. Torrey, Jason P. Killgore, Lauren F. Greenlee, Robert L. Amaro

… Oxidation behavior of iron nanoparticles in mixed matrix …

How Oxidation and Dissolution in Diabase and Granite Control Porosity during Weathering

January 13, 2015

Author(s)

Ekaterina Bazilevskaya, Gernot Rother, David F. Mildner, Milan Pavich, David Cole, Maya P. Bhatt, Lixin Jin, Carl I. Steefel, Susan L. Brantley

… How Oxidation and Dissolution in Diabase and Granite Control …

Nanosilver suppresses growth and induces oxidative damage to DNA in Caenorhabditis elegans

May 2, 2013

Author(s)

Bryant C. Nelson, Bryce J. Marquis, Piper R. Hunt, Katherine M. Tyner, Sean Conklin, Nicholas Olejnik, Robert L. Sprando

… Nanosilver suppresses growth and induces oxidative damage to DNA in Caenorhabditis elegans …

Gate Oxide Long-Term Reliability of 4H-SiC MOS Devices

October 14, 2009

Author(s)

Liangchun (. Yu, Kin P. Cheung, Greg Dunne, Kevin Matocha, John S. Suehle, Kuang Sheng

… Gate Oxide Long-Term Reliability of 4H-SiC MOS Devices …

Gate Oxide Long-Term Reliability of 4H-SiC MOS Devices

October 11, 2009

Author(s)

Liangchun (. Yu, Kin P. Cheung, Greg Dunne, Kevin Matocha, John S. Suehle, Kuang Sheng

… Gate Oxide Long-Term Reliability of 4H-SiC MOS Devices …

Circular dichroism in second harmonic generation from oxidized Si (001)

January 1, 2006

Author(s)

X Li, J Willits, Steven T. Cundiff, I M. Aarts, A A. Stevens, D S. Dessau

… Circular dichroism in second harmonic generation from oxidized Si (001) …

Reliability Implications of Scaling Gate Oxides in Deep Submicron CMOS Technologies

March 18, 2004

Author(s)

John S. Suehle

… Reliability Implications of Scaling Gate Oxides in Deep Submicron CMOS Technologies …

Polarized Light Scattering by Dielectric And Metallic Spheres on Oxidized Silicon Surfaces

January 1, 2004

Author(s)

J H. Kim, S H. Ehrman, G W. Mulholland, Thomas Germer

… Light Scattering by Dielectric And Metallic Spheres on Oxidized Silicon Surfaces …

Holmium Oxide Solution as a Prototype Intrinsic Standard in Molecular Absorption Spectrophotometry

August 8, 2003

Author(s)

John C. Travis, David L. Duewer

… Holmium Oxide Solution as a Prototype Intrinsic Standard in Molecular …

Defect Generation in Ultra-thin Oxide Over Large Fluence Range

October 21, 2002

Author(s)

Da-Wei Heh, Eric M. Vogel, J B. Bernstein

… Defect Generation in Ultra-thin Oxide Over Large Fluence Range …

Ultra-Thin Gate Oxide Reliability: Physical Models, Statistics, and Characterization

June 1, 2002

Author(s)

John S. Suehle

… Ultra-Thin Gate Oxide Reliability: Physical Models, Statistics, and …

The Oxidation of Deuterium-, Acetylene- and Ethylene-Terminated Si (100) by Atomic Oxygen

January 1, 2002

Author(s)

Maritoni A. Litorja, S A. Buntin

… The Oxidation of Deuterium-, Acetylene- and Ethylene-Terminated …

In-Situ Conductivity Characterization of Oxide Thin Film Growth Phenomena on Microhotplates

February 11, 1998

Author(s)

F DiMeo, Richard E. Cavicchi, Stephen Semancik, John S. Suehle, N H. Tea, John A. Small, J T. Armstrong, J T. Kelliher

… In-Situ Conductivity Characterization of Oxide Thin Film Growth Phenomena on Microhotplates …

A New Oxide Degradation Mechanism for Stresses in the Fowler-Nordheim Tunneling Regime

December 31, 1996

Author(s)

A. Martin, John S. Suehle, P Chaparala, P. O'Sullivan, A. Mathewson

… A New Oxide Degradation Mechanism for Stresses in the …

Multistate Interactions in Nitric Oxide Probed by Laser-induced Grating Spectroscopy

January 1, 1995

Author(s)

E F. Mccormack, P M. Dehmer, J L. Dehmer, S T. Pratt

… Multistate Interactions in Nitric Oxide Probed by Laser-induced Grating Spectroscopy …

Effect of Anneal Temperature on Si/Buried Oxide Interface Roughness of SIMOX

December 31, 1994

Author(s)

C. Jacobs, A. Genis, L. P. Allen, Peter Roitman

… Effect of Anneal Temperature on Si/Buried Oxide Interface Roughness of SIMOX …

Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides

December 1, 1992

Author(s)

R. E. Stahlbush, G. J. Campisi, J. B. McKitterick, W. P. Maszara, Peter Roitman, George A. Brown

… Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides …

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