Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

In-Situ Conductivity Characterization of Oxide Thin Film Growth Phenomena on Microhotplates

Published

Author(s)

F DiMeo, Richard E. Cavicchi, Stephen Semancik, John S. Suehle, N H. Tea, John A. Small, J T. Armstrong, J T. Kelliher
Citation
Journal of Vacuum Science and Technology A
Volume
16

Citation

DiMeo, F. , Cavicchi, R. , Semancik, S. , Suehle, J. , Tea, N. , Small, J. , Armstrong, J. and Kelliher, J. (1998), In-Situ Conductivity Characterization of Oxide Thin Film Growth Phenomena on Microhotplates, Journal of Vacuum Science and Technology A (Accessed December 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 10, 1998, Updated October 12, 2021