Martin, A.
, Suehle, J.
, Chaparala, P.
, O'Sullivan, P.
and Mathewson, A.
(1996),
A New Oxide Degradation Mechanism for Stresses in the Fowler-Nordheim Tunneling Regime, Proc., 34th Annual IEEE International Reliability Physics Symposium, Dallas, TX, USA
(Accessed May 5, 2025)
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A New Oxide Degradation Mechanism for Stresses in the Fowler-Nordheim Tunneling Regime
Published
Author(s)
A. Martin, , P Chaparala, P. O'Sullivan, A. Mathewson
Proceedings Title
Proc., 34th Annual IEEE International Reliability Physics Symposium
Conference Location
Dallas, TX, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1996, Updated October 12, 2021