Martin, A.
, Suehle, J.
, Chaparala, P.
, O'Sullivan, P.
and Mathewson, A.
(1996),
A New Oxide Degradation Mechanism for Stresses in the Fowler-Nordheim Tunneling Regime, Proc., 34th Annual IEEE International Reliability Physics Symposium, Dallas, TX, USA
(Accessed December 3, 2023)
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A New Oxide Degradation Mechanism for Stresses in the Fowler-Nordheim Tunneling Regime
Published
Author(s)
A. Martin, , P Chaparala, P. O'Sullivan, A. Mathewson
Proceedings Title
Proc., 34th Annual IEEE International Reliability Physics Symposium
Conference Location
Dallas, TX, USA
Pub Type
Conferences
Citation
Created December 30, 1996, Updated October 12, 2021