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A New Oxide Degradation Mechanism for Stresses in the Fowler-Nordheim Tunneling Regime

Published

Author(s)

A. Martin, John S. Suehle, P Chaparala, P. O'Sullivan, A. Mathewson
Proceedings Title
Proc., 34th Annual IEEE International Reliability Physics Symposium
Conference Location
Dallas, TX, USA

Citation

Martin, A. , Suehle, J. , Chaparala, P. , O'Sullivan, P. and Mathewson, A. (1996), A New Oxide Degradation Mechanism for Stresses in the Fowler-Nordheim Tunneling Regime, Proc., 34th Annual IEEE International Reliability Physics Symposium, Dallas, TX, USA (Accessed June 23, 2024)

Issues

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Created December 30, 1996, Updated October 12, 2021