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PUBLICATIONS

Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides

Published

Author(s)

R. E. Stahlbush, G. J. Campisi, J. B. McKitterick, W. P. Maszara, Peter Roitman, George A. Brown
Citation
IEEE Transactions on Nuclear Science
Volume
NS-39
Issue
6
Pub Type
Journals

Citation

Stahlbush, R. , Campisi, G. , McKitterick, J. , Maszara, W. , Roitman, P. and Brown, G. (1992), Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides, IEEE Transactions on Nuclear Science (Accessed October 9, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created November 30, 1992, Updated October 12, 2021
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