Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides

Published

Author(s)

R. E. Stahlbush, G. J. Campisi, J. B. McKitterick, W. P. Maszara, Peter Roitman, George A. Brown
Citation
IEEE Transactions on Nuclear Science
Volume
NS-39
Issue
6

Citation

Stahlbush, R. , Campisi, G. , McKitterick, J. , Maszara, W. , Roitman, P. and Brown, G. (1992), Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides, IEEE Transactions on Nuclear Science (Accessed December 4, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 30, 1992, Updated October 12, 2021