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Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides

Published

Author(s)

R. E. Stahlbush, G. J. Campisi, J. B. McKitterick, W. P. Maszara, Peter Roitman, George A. Brown
Citation
IEEE Transactions on Nuclear Science
Volume
NS-39
Issue
6

Citation

Stahlbush, R. , Campisi, G. , McKitterick, J. , Maszara, W. , Roitman, P. and Brown, G. (1992), Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides, IEEE Transactions on Nuclear Science (Accessed February 29, 2024)
Created November 30, 1992, Updated October 12, 2021