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Conferences

Towards Multiscale Simulations of Filled and Nanofilled Polymers

June 1, 2001

Author(s)

S C. Glotzer, Francis W. Starr

We perform simulations of filled and nanofilled polymers using a combination of molecular and mesoscale simulation techniques. Molecular dynamics simulations

Validation of Scanning Probe Moire Technique With the CTE of Gold

June 1, 2001

Author(s)

Elizabeth S. Drexler, T A. Winningham

Low expansion materials used in electronic devices require a tool that has a commensurate resolution for measuring deformation, such as the atomic force or

Wavelength Control and Calibration for Wavelength Division Multiplexed Optical Communication

June 1, 2001

Author(s)

Sarah L. Gilbert, William C. Swann, Tasshi Dennis

Wavelength calibration of equipment in the 1500 nm region is essential to ensure channel stability and characterize optical components for wavelength division

Archival and Theoretical Considerations for Isotopic Dependence in the e-H₂ Fixed Points

June 1, 2001

Author(s)

F Pavese, Weston L. Tew, A G. Steele

We examine these isotopic dependence for the case of the e-H2 triple point (TP), and the two vapor pressure (VP) points of the ITS-90 defined near 33 kPa and

The NIST Industrial Thermometer Calibration Laboratory

June 1, 2001

Author(s)

C D. Vaughn, Gregory F. Strouse

The NIST Industrial Thermometer Calibration (ITC) Laboratory provides calibrations of industrial thermometers over the range from 196 C to 550 C. The different

Special Problems When Realising the Triple Point of Hydrogen as a Defining Fixed Point of the ITS-90

June 1, 2001

Author(s)

B Fellmuth, D I. Head, F Pavese, A Szmyrka-Grzebyk, Weston L. Tew

The two special problems, which appear when realising the triple point of hydrogen as a temperature fixed point due to the influences of the deuterium content

A Framework for Managing Faults and Attacks in All-Optical Transport Networks

June 1, 2001

Author(s)

J K. Patel, S U. Kim, David H. Su, M Subramaniam, H A. Choi

ult and attack survivability in all-optical transport networks (AOTNs) require new approaches because of unique transmission characteristics. Specifically

Characterization of Porous Low-k Dielectric Thin Films Using X-ray Reflectivity and Small-angle Neutron Scattering and Ion Scattering

June 1, 2001

Author(s)

H Y. Lee, Eric K. Lin, Haonan Wang, Wen-Li Wu, W Chen, T A. Deis

A novel methodology using a combination of ion scattering, x-ray reflectivity (SXR), and small angle neutron scattering was used to characterize the structure

NIST Colorimetric Calibration Facility for Displays - Part 2

June 1, 2001

Author(s)

F Manoocheri, Steven W. Brown, Yoshi Ohno

velopment of a calibration facility for spectroradiometric, colorimetric, and goniometric measurements of displays, display colorimeters, and spectroradiometers

A New Type of Frequency Chain and its Application to Fundamental Frequency Metrology

June 1, 2001

Author(s)

Thomas Udem, J Reichert, R Holzwarth, Scott Diddams, D J. Jones, Jun Ye, S T. Cundiff, T W. Hansch, John L. Hall

A suitable femtosecond (fs) laser system can provide a broad band comb of stable optical frequencies and thus can serve as an rf/opticalcoherent link. In this

X-Ray Metrology by Diffraction and Reflectivity

June 1, 2001

Author(s)

D K. Bowen, R Deslattes

X-ray methods can provide measurements that, for certain parameters of great technological importance, are the most accurate and sensitive available. Their

Time-Shifting the Dynamics of Li₂ Multistate Rovibrational Wave Packets by State Selective Coherent Phase Control

June 1, 2001

Author(s)

Z Amitay, R Uberna, S R. Leone

State-selective coherent phase control using single shaped femtosecond laser pulses is implemented to achieve forward and backward shifts in time (up to a

AlGaN Schottky Diodes for Short-Wavelength UV Applications

June 1, 2001

Author(s)

P P. Chow, J J. Klaassen, Robert E. Vest, J M. VanHove, A Wowchak, C Polley

High performance ultraviolet (UV) detectors have been fabricated using plasma-enhanced molecular beam epitaxy (MBE). The realized AlGaN Schottky detectors

Quantum Gates Using Motional States in an Optical Lattice

June 1, 2001

Author(s)

E Charron, Eite Tiesinga, F H. Mies, Carl J. Williams

We Study an implementation of a two-qubit universal quantum gate with neutral 87Rb atoms trapped in a far-detuned two-color optical lattice. The qubit states

A Comparison of Usage Evaluation and Inspection Methods for Assessing Groupware Usability

June 1, 2001

Author(s)

S Greenbaum, C Gutwin, Michelle P. Steves

Evaluating groupware usability can be a difficult problem. Many researchers believe that groupware can only be evaluated by studying real collaborators in their

High Performance Transition-Edge-Sensor Based Detectors

June 1, 2001

Author(s)

Gene C. Hilton, Steven Deiker, Kent D. Irwin, Sae Woo Nam, John M. Martinis, David A. Wollman

High performance detectors utilizing transition-edge sensors (TES) have been demonstrated for photon energies ranging from the infrared to the x-ray. In the

Trioxane-Air Counterflow Diffusion Flames in Normal and Microgravity

May 22, 2001

Author(s)

Gregory T. Linteris, M D. Rumminger, D L. Urban

Trioxane, a weakly bound polymer of formaldehyde (C3H6O3, melting point 61 deg C, boiling point 115 deg C), is a uniquely suited compound for studying material

Physical and Chemical Aspects of Fire Suppression in Extraterrestrial Environments

May 22, 2001

Author(s)

Fumiaki Takahashi, Gregory T. Linteris, Vishwanath R. Katta

A fire, whether in a spacecraft or in occupied spaces on extraterrestrial bases, can lead to mission termination or loss of life. While the fire-safety record

Broadband Josephson Voltage Standards

May 20, 2001

Author(s)

Clark A. Hamilton, Samuel P. Benz

A Josephson junction is a perfect frequency to voltage converter, that is, V=f/K j where K j = 483597.9 GHz/V. This unique property has been used to convert a

Challenges of High-[kappa] Gate Dielectrics for Future MOS Devices

May 13, 2001

Author(s)

John S. Suehle, Eric M. Vogel, Monica D. Edelstein, Curt A. Richter, Nhan Van Nguyen, Igor Levin, Debra Kaiser, Hanchang F. Wu, J B. Bernstein

As the feature sizes of complementary metal-oxide-semiconductor (CMOS) devices are scaled downward, the gate dielectric thickness must also decrease to maintain

Compressive Strengthening of Sapphire by Neutron Irradiation

May 9, 2001

Author(s)

T M. Regan, D C. Harris, R M. Stroud, J R. White, D W. Blodgett, K C. Baldwin, J A. Miragliotta, M E. Thomas, M J. Linevsky, J W. Giles, T A. Kennedy, M Fatemi, David R. Black

Neutron irradiation of sapphire with 1 1022(=1 MeV)/m2 increases the c-axis compressive strength by a factor of 3 at 600 C. The mechanism of strength

Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices

May 7, 2001

Author(s)

Angela Hodge, R. Newcomb, Allen R. Hefner Jr.

An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on

Sensor Networking and Interface Standardization

May 1, 2001

Author(s)

Kang B. Lee

Sensors are used in various industries, ranging from aerospace, automotive, biomedicine, building, industrial automation, manufacturing, and process control to

Open System Architecture for Real-time Control Using an UML Based Approach

May 1, 2001

Author(s)

Hui-Min Huang, Elena R. Messina, Harry A. Scott, James S. Albus, Frederick M. Proctor, William P. Shackleford

We describe a generic architecture that is applicable to the engineering of many real-time control problems. We further describe how UML is used to apply the

Characteristics of ADLs That Support Good Architecture Documentation: A Position Paper for the SEI Software

May 1, 2001

Author(s)

Christopher E. Dabrowski

One of the potential benefits of describing software architecture is the ability to provide greater clarity and understanding than what is possible in program

Large Anisotropy Via Oblique Sputtering of Ta Underlayers

May 1, 2001

Author(s)

John E. Bonevich, Robert D. McMichael, Chang H. Lee, P J. Chen, W Wyatt Miller, William F. Egelhoff Jr.

Anisotropy fields in excess of 120 KA/m (1500 Oe) have been produced in 3 nm to 5 nm thick polycrystalline films of Co by oblique sputtering of Ta underlayers

Extrusion Visualization - from Blend Structure to Sharkskin

May 1, 2001

Author(s)

Kalman D. Migler

Over the last five years, we have developed optical technologies for in-line monitoring of extrusion. We review two areas where we have succeeded in uncovering

Luminous Flux Calibrations of LEDs at NIST

May 1, 2001

Author(s)

Carl C. Miller, Yoshihiro Ohno

The total luminous flux (lumen) is one of the most important characteristics of Light Emitting Diodes (LEDs), and is commonly measured using integrating sphere

Spectroradiometer Characterization for Colorimetry of LEDs

May 1, 2001

Author(s)

Yoshihiro Ohno, B Kranicz

The uncertainties in color measurements of LEDs by spectroradiometers can be much larger than those for traditional broadband sources due to the quasi

Prediction of Building Integrated Photovoltaic Cell Temperatures

May 1, 2001

Author(s)

Mark W. Davis, Arthur H. Fanney, Brian P. Dougherty

A barrier to the widespread application of building integrated photovoltaics (BIPV) is the lack of validated predictive performance tools. Architects and

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