Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices

Published

May 7, 2001

Author(s)

Angela Hodge, R. Newcomb, Allen R. Hefner Jr.

Abstract

An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal. This paper focuses on comparing the results of various analog-to-digital converters (ADCs) used to evaluate the functional integrity of a biosensor. The objective of this research is to determine key issues associated with providing the metrology infrastructure needed for developing the design reuse approach for multi-technology Systems-on-a-Chip (SoC) devices.

Proceedings Title

Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems

Conference Dates

May 6-9, 2001

Conference Location

Sydney, 1, AS

Pub Type

Conferences

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Keywords

BIST, ADC, oscillation, sensor, system-on-a-chip (SOC), mixed signal device

Citation

Hodge, A. , Newcomb, R. and Hefner Jr., A. (2001), Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices, Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems, Sydney, 1, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11649 (Accessed October 17, 2025)