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Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices

Published

Author(s)

Angela Hodge, R. Newcomb, Allen R. Hefner Jr.

Abstract

An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal. This paper focuses on comparing the results of various analog-to-digital converters (ADCs) used to evaluate the functional integrity of a biosensor. The objective of this research is to determine key issues associated with providing the metrology infrastructure needed for developing the design reuse approach for multi-technology Systems-on-a-Chip (SoC) devices.
Proceedings Title
Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems
Conference Dates
May 6-9, 2001
Conference Location
Sydney, 1, AS

Keywords

BIST, ADC, oscillation, sensor, system-on-a-chip (SOC), mixed signal device

Citation

Hodge, A. , Newcomb, R. and Hefner Jr., A. (2001), Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices, Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems, Sydney, 1, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11649 (Accessed February 22, 2024)
Created May 6, 2001, Updated October 12, 2021