Hodge, A.
, Newcomb, R.
and Hefner Jr., A.
(2001),
Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices, Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems, Sydney, 1, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11649
(Accessed December 14, 2024)
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Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices
Published
Author(s)
, R. Newcomb,
Abstract
An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal. This paper focuses on comparing the results of various analog-to-digital converters (ADCs) used to evaluate the functional integrity of a biosensor. The objective of this research is to determine key issues associated with providing the metrology infrastructure needed for developing the design reuse approach for multi-technology Systems-on-a-Chip (SoC) devices.Proceedings Title
Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems
Conference Dates
May 6-9, 2001
Conference Location
Sydney, 1, AS
Pub Type
Conferences
Download Paper
Keywords
BIST, ADC, oscillation, sensor, system-on-a-chip (SOC), mixed signal device
Citation
Issues
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Created May 6, 2001, Updated October 12, 2021