NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
AlGaN Schottky Diodes for Short-Wavelength UV Applications
Published
Author(s)
P P. Chow, J J. Klaassen, Robert E. Vest, J M. VanHove, A Wowchak, C Polley
Abstract
High performance ultraviolet (UV) detectors have been fabricated using plasma-enhanced molecular beam epitaxy (MBE). The realized AlGaN Schottky detectors exhibit high responsivity, sharp spectral cutoff and high shunt resistance of several giga-ohns for 0.5 mm2 active area devices. Quantitative measurements have been carried out on these detectors in the photon energy range from <1 to > 10 eV (from approximately 1200 to 120 nm in wavelength). Very short UV spectral measurement of these AlGaN detectors is reported for the first time using high intensity sources. The detectors exhibited almost eight orders of magnitude in response dynamic range in that spectral span. Reliability of the devices is evaluated after exposure to repeated DUV irradiation.
Proceedings Title
Photodetectors: Materials and devices, Conference | 6th | Photodectors: Materials and Devices VI | SPIE
Conference Dates
January 1, 2001
Conference Location
Undefined
Conference Title
Proceedings of SPIE--the International Society for Optical Engineering
Chow, P.
, Klaassen, J.
, Vest, R.
, VanHove, J.
, Wowchak, A.
and Polley, C.
(2001),
AlGaN Schottky Diodes for Short-Wavelength UV Applications, Photodetectors: Materials and devices, Conference | 6th | Photodectors: Materials and Devices VI | SPIE, Undefined
(Accessed October 11, 2025)