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Conferences

Single-Integral-Equation Method for Three-Dimensional Scattering

July 1, 2001

Author(s)

Egon Marx

The fields scattered by a homogeneous dielectric or finitely conducting object can be obtained from two tangential vector fields, the components of the electric

Panel Session: Educational Needs for Simulation - A Government Perspective

July 1, 2001

Author(s)

Charles R. McLean

At the National Institute of Standards and Technology, the goal of the program in Manufacturing Simulation and Visualization is to accelerate the development of

Metrology for the Optoelectronics Industry

July 1, 2001

Author(s)

Gordon W. Day

Electrometrology and NIST -- New Directions

July 1, 2001

Author(s)

William E. Anderson

I gaze into a somewhat cloudy crystal ball to predict the directions of electrical metrology in the next fifteen years. The emphasis on standards based on

Interference of Bluetooth and IEEE 802.11: Simulation Modeling and Performance Evaluation

July 1, 2001

Author(s)

Nada T. Golmie, R E. Van Dyck, A Soltanian

The emergence of several radio technologies such as Bluetooth, and IEEE 802.11 operating in the 2.4 GHz unlicensed ISM frequency band may lead to signal

Ultimate Capacities of Low-Rise Steel Frames in Turbulent Wind

July 1, 2001

Author(s)

S Jang, L L. Lu, Fahim H. Sadek, Emil Simiu

This paper is a derivative of G2001-1392, Database-Assisted Wind Load Capacity Estimates for Low-Rise Steel Frames, by Jang, S., et al., intended for

Electron Interactions with c-C4F8

July 1, 2001

Author(s)

Loucas G. Christophorou, James K. Olthoff

Electron, Transport, Ionization and Attachment Coefficients in C2F4 and C2F4/Ar Mixtures

July 1, 2001

Author(s)

Amanda N. Goyettes, G. de Hann, Yicheng Wang, Loucas G. Christophorou, James K. Olthoff

SI Traceability of Force at the Nanonewton Level

July 1, 2001

Author(s)

David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, L. A. Feeney, Edwin R. Williams

Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI)

Novel High-Voltage Range Resistors for Ac-DC Thermal Converters

July 1, 2001

Author(s)

H. O. Wolcott, Joseph R. Kinard Jr., Thomas E. Lipe Jr.

This paper discusses the factors contributing to the ac-dc differences of high-voltage thermal converters. A novel resistor designed to minimize these

Recent Developments in the NIST Cryogenic Thermal Transfer Standard Project

July 1, 2001

Author(s)

Thomas E. Lipe Jr., Joseph R. Kinard Jr., Carl D. Reintsema

We describe the development of a cryogenic thermal transfer standard (CTTS) from the first prototype in 1997 to the present version. A description of the

The Expanding Role of Simulation in Future Manufacturing

July 1, 2001

Author(s)

Charles R. McLean, Swee K. Leong

Simulation technology holds tremendous promise for reducing costs, improving quality, and shortening the timeto- market for manufactured goods. Unfortunately

Influence of Filler Particles and Filler Clusters on Phase Separation in Binary Polymer Blends

July 1, 2001

Author(s)

Y. L. Jiang, A Saxena, T Lookman, Jack F. Douglas

Motivated by recent experiments on filled polymer thin films, we study the effect of the presence of filler particles on phase separating mixtures. using a

Plasma Broadening and Shifts of Non-Hydrogenic Spectral Lines: An Overview of Recent Results

July 1, 2001

Author(s)

N Konjevic, A Lesage, Jeffrey R. Fuhr, Wolfgang L. Wiese

The recent status of the experimental studies of plasma broadening and shifts of non-hydrogenic neutral atom and positive ion spectral lines is reviewed and the

FEA Modeling and Hardness Performance Prediction of Rockwell Diamond Indenters

July 1, 2001

Author(s)

Hui Zhou, Jun-Feng Song, Samuel Low, Li Ma

The difficulty in manufacturing Rockwell diamond indenters to the required geometric specifications has resulted in most commercially manufactured indenters to

Fast and Accurate Characterization of Optical Components Using Low-Coherence Interferometry

July 1, 2001

Author(s)

Shellee D. Dyer, Robert J. Espejo

We show that the dispersion of optical components can be determined from a single low-coherence interferometric measurement. This technique can be applied to

A Capacitance Measurement System Using an Inductive Voltage Divider (IVD) Bridge

July 1, 2001

Author(s)

Bryan C. Waltrip, Andrew D. Koffman, S. Avramov

A new system to characterize the magnitude and phase characteristics of 1 pF to 1 uF capacitance standards over the 50 Hz to 100 kHz frequency range is

Characterization of Paralleled Super Junction MOSFET Devices under Hard- and Soft-Switching Conditions

June 30, 2001

Author(s)

X Huang, H. Yu, Jih-Sheng Lai, Allen R. Hefner Jr., David W. Berning

The super junction (SJ) MOSFET exhibits conduction and switching properties similar to those of conventional power MOSFETs. In this paper we investigate

Silicon Carbide PiN and Merged PiN Schottky Power Diode Models Implemented in the Saber Circuit Simulator

June 30, 2001

Author(s)

Ty R. McNutt, Allen R. Hefner Jr., A. Montooth, J L. Duliere, David W. Berning, Ranbir Singh

Dynamic compact electrothermal models are developed for Silicon Carbide Power diodes. Model parameters are extracted and model results are presented for both

Compensation for Stray Light in Projection Display Metrology

June 30, 2001

Author(s)

Paul A. Boynton, Edward F. Kelley

Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation

A Reference Tristimulus Colorimeter

June 25, 2001

Author(s)

George P. Eppeldauer

The accuracy of tristimulus colorimeters can be increased by using detector standards instead of traditional lamp standards for calibration. After high accuracy

Security - Revenue Generator and Mission Enabler

June 21, 2001

Author(s)

G Stoneburner

We need to facilitate a change in user perception of security from a hindrance to an essential revenue generator and mission enabler. The Common Criteria

Codes and Regulations.

June 18, 2001

Author(s)

J J. Beitel

Armstrong World Industries: Application of Fire Tests

June 18, 2001

Author(s)

T W. Fritz

Combustion of Mixtures of Weathered Alaskan Crude Oils and Water Under External Heat Flux.

June 12, 2001

Author(s)

A Y. Walavalkar, A K. Kulkarni

High Temperature Characteristics of 5kV, 20 A 4H-SiC PiN Rectifiers

June 7, 2001

Author(s)

Ranbir Singh, Allen R. Hefner Jr., David W. Berning, M. Palmer

This paper reports in detail, the design, a manufactuable fabrication process, and high temperature characteristics of a 4H-SiC rectifier with a 5 kV, 20 A

Interferometric Figure Metrology; Enabling In-House Traceability

June 6, 2001

Author(s)

Christopher J. Evans, Angela Davies, Tony L. Schmitz, R E. Parks

The basic goal of the Advanced Optics Metrology program at NIST''s Manufacturing Engineering Laboratory is to help industry ensure that their measurement

MEMS Test Structures for Mechanical Characterization of VLSI Thin Films

June 6, 2001

Author(s)

David L. Herman, Michael Gaitan, Don DeVoe

Flat-Panel-Display Measurements and Standards

June 1, 2001

Author(s)

Edward F. Kelley

100 Years of Optical Science and Metrology at NIST

June 1, 2001

Author(s)

William R. Ott

The National Bureau of Standards (NBS) was formed by Congress 100 years ago. The early Bureau was a small organization, founded at the beginning of the age of

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