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Joseph Kopanski, Jay F. Marchiando, Brian G. Rennex
The Scanning Capacitance Microscope (SCM) is a leading candidate for a metrology capable of measuring the two-dimensional (2-D) carrier profiles of cross
Allen R. Hefner Jr., Ranbir Singh, Jih-Sheng Lai, David W. Berning, Sebastien Bouche, Christophe C. Chapuy
The electrical performance of Silicon Carbide (SiC) diodes are evaluated and compared to commercially available Silicon (Si) diodes in the voltage range from
Bin Wang, John S. Suehle, Eric M. Vogel, J B. Bernstein
We studied the effects of stress interruption on the time-dependent dielectric breakdown (TDDB) Life distributions of 2.0 nm oxynitride gate dielectric films
John S. Suehle, Eric M. Vogel, Bin Wang, J B. Bernstein
A comprehensive time-dependent dielectric breakdown study was conducted on sub-3 nm SiO 2 films over a temperature range from 22 0C to 350 0C. Two breakdown
Cubic L 1 and L 2 interpolating splines based on C 1 smooth piecewise cubic Sibson elements on a tensor-product grid are investigated. Computational tests were
Head tracking is an important primitive for smart environments and perceptual user interfaces where the poses and movements of body parts need to be determined
Chiara F. Ferraris, L Brower, C H. Ozyildirim, J A. Daczko
The slump test is widely used to evaluate the workability of Concrete. However it has serious drawbacks, especially for self-compacting concrete (SCC). Other
The emergence of quantum metrology is expressed in modern electrical standards, primarily through the Josephson effect and the quantum Hall effect. The
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models
XML developers claim they do it. OASIS, NIST, and W3C are building it. And, standards often require it. What is it?Conformance is usually defined as a way to
Elizabeth N. Fong, Nenad Ivezic, Thomas R. Rhodes, Y Peng
The potential of agent-based systems has not been realized yet, in part, because of the lack of understanding of how the agent technology supports industrial
Stephen D. Ridder, Aaron N. Johnson, Pedro I. Espina, Frank S. Biancaniello, G J. DelCorso
The performance of a commercial gas-metal atomizer was studied using a number of previously published research techniques. initially the flow was visualized
The work of J.R. Rice has been central to developments in solid mechanics over the last thirty years. This volume collects 21 articles on deformation and
This paper is concerned with the formation of polychorinated organics in the gas phase in combustion systems. The results are derived from simulation studies
Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude
Steven Deiker, James A. Chervenak, Gene C. Hilton, Martin Huber, Kent D. Irwin, John M. Martinis, Sae Woo Nam, David A. Wollman
Both the x-ray astrophysics and microanalysis communities have a need for large format arrays of high-spectral-resolution x-ray detectors. To meet this need, we
Harold Sanchez, J. Cioffi, H. Laiz, D. Bennett, H. Ferreira, R. Ortega, Nile M. Oldham, Mark E. Parker
An international comparison of dc and low-frequency electrical units conducted between 19 laboratories in 16 countries in the Americas is described. The
The electromagnetic reverberation chamber is widely used as a test facility to generate complex fields for interference and compatibility measurements. The
Software developers use a variety of methods, including both formal methods and testing, to argue that their systems are suitable components for high assurance
This paper presents an overview of a neutral reference architecture for integrating distributed manufacturing simulation systems with each other, with other
Jeffrey Jargon, P. Kirby, Kuldip Gupta, Lawrence P. Dunleavy, T. Weller
This paper demonstrates that on-wafer open-short-load-thru (OSLT) calibrations of vector network analyzers can be improved by applying artificial neural
We present a statistical theory for estimating the directive characteristics of unintentional emitters based on the electrical size of the device. We compare
Joseph A. Stroscio, Robert Celotta, Steven R. Blankenship, E Hudson, Aaron P. Fein
We describe an experimental system with the goal of providing new measurement capabilities for the study of quantum and spin electronic systems on the nanometer
John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno
A prototype display measurement assessment transfer standard (DMATS) is being developed by NIST to assist the display industry in standardizing measurement
One element of a multi-year calibration program between NIST and the NASA EOS Project Science Office has been the development and deployment of a portable
Scanning electron microscopy has distinct advantages for characterization of concrete, cement, and aggregate microstructure, and in the interpretation of causes
In recent years a growing number of government and university labs, non-profit organizations and even a few for-profit corporations have found that making their