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Interferometric Figure Metrology; Enabling In-House Traceability



Christopher J. Evans, Angela Davies, Tony L. Schmitz, R E. Parks


The basic goal of the Advanced Optics Metrology program at NIST''s Manufacturing Engineering Laboratory is to help industry ensure that their measurement results of optical figure and wavefront are traceable. This paper underscores the importance of traceability and reviews the facilities and projects dedicated to achieving that object.
Conference Dates
July 29-31, 2001
Conference Location
San Diego, CA
Conference Title
SPIE Annual Meeting


figure, interferometer, traceability, uncertainty, wavefront


Evans, C. , Davies, A. , Schmitz, T. and Parks, R. (2001), Interferometric Figure Metrology; Enabling In-House Traceability, SPIE Annual Meeting, San Diego, CA (Accessed May 20, 2024)


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Created June 6, 2001, Updated February 19, 2017