The program in atomic spectroscopy at NIST continues to provide accurate reference data on spectral lines and energy levels for a wide variety of important applications. With spectrometers at NIST that can record spectra from the extreme ultraviolet (1 nm) to the far infrared (180,000 nm), we can measure spectra over a large spectral range. Some of these spectrometers are the most powerful of their type in the world. We recently used our 10.7-m normal-incidence vacuum spectrograph to make precision measurements of the wavelengths of lasing lines in a commercial fluorine excimer laser at 157 nm. These results establish standard values to be applied in the design of optics for microlithography at this wavelength. Our high resolution Fourier transform spectrometer is being used to measure wavelengths and transition probabilities for rare earth atoms and ions that are used as additives in the production of high intensity discharge lamps. The data allow lamp designers to model the processes occurring in the discharge. Our 10.7-m grazing incidence spectrograph is being used to obtain data for the diagnostics of magnetic fusion research plasmas as well as for astronomical applications such as the Chandra X-ray Observatory. Precision laser spectroscopy on neutral Li is being carried out to test the validity of quantum electrodynamics (QED) calculations. Finally, we are continuing to carry out critical compilations of wavelengths, energy levels, and transition probabilities and to improve our Atomic Spectra Database on the World Wide Web. These data activities support many applications throughout the industrial and scientific community.
Harnessing Light: Optical Science and Metrology at NIST, Conference | | Harnessing Light: Optical Science and Metrology at NIST | SPIE
August 1-2, 2001
Proceedings of SPIE--the International Society for Optical Engineering
atomic spectroscopy, spectrometers
Atomic Spectroscopy at NIST 2001, Harnessing Light: Optical Science and Metrology at NIST, Conference | | Harnessing Light: Optical Science and Metrology at NIST | SPIE
(Accessed March 3, 2024)