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Conferences

Simulations of Filled Polymers on Multiple Length Scales

July 1, 2001

Author(s)

Francis W. Starr, S C. Glotzer

We present simulation results of the effect of nanoscopic and micron-sized fillers on the structure, dynamics, and mechanical properties of polymer melts and

FEA Modeling and Hardness Performance Prediction of Rockwell Diamond Indenters

July 1, 2001

Author(s)

Li Ma, J Zhou, Samuel R. Low III, Jun-Feng Song

The difficulty in manufacturing Rockwell diamond indenters to the required geometric specifications has resulted in most commercially manufactured indenters to

DTA/TGA Study of Eutectic Melting in the System BaF₂-BaO-Y₂O₃-CuO_x-H₂O

July 1, 2001

Author(s)

Lawrence P. Cook, Winnie K. Wong-Ng, J Suh

Differential thermal analysis and thermogravimetric analysis (DTA/TGA) experiments have been completed in the BaF2-BaO-Y2O3-CuOx-H2O system at various oxygen

An Introduction to the Phase-Field Method: Simulation of Alloy Solidification

July 1, 2001

Author(s)

William J. Boettinger, James A. Warren, C Beckermann, A N. Karma

An overview of the phase-field method for modeling alloy solidification is presented together with several example results. Using a phase-field variable and a

The Significance of Percolation on the Dynamics of Polymer Chains Bound to Carbon Black

July 1, 2001

Author(s)

A Nakatani, R Ivkov, P Papanek, C L. Jackson, H Yang, L T. Nikiel, M Gerspacher

Neutron time-of-flight (TOF) spectroscopy is used to compare the chain dynamics of pure polyisoprene with polyisoprene bound to the surface of various grades of

NIST Role in Radiometric Calibrations for Remote Sensing Programs at NASA, NOAA, DOE and DOD

July 1, 2001

Author(s)

Albert C. Parr, Raju V. Datla

The Optical Technology Division (OTD) at the National Institute of Standards and Technology (NIST) has been actively involved in providing calibration support

Modeling Technology for a Model-Intensive Enterprise

July 1, 2001

Author(s)

Michael Gruninger, David W. Flater, Peter O. Denno

The Object Management Group (OMGtm) is defining specifications supporting a modeling environment that permits models from a family of modeling languages to

Single-Integral-Equation Method for Scattering by Dielectric Cylinders

July 1, 2001

Author(s)

Egon Marx

Electromagnetic scattering of an incident plane monochromatic wave by dielectric or finitely conducting infinite cylinders of arbitrary shape, possibly in the

Single-Integral-Equation Method for Three-Dimensional Scattering

July 1, 2001

Author(s)

Egon Marx

The fields scattered by a homogeneous dielectric or finitely conducting object can be obtained from two tangential vector fields, the components of the electric

Panel Session: Educational Needs for Simulation - A Government Perspective

July 1, 2001

Author(s)

Charles R. McLean

At the National Institute of Standards and Technology, the goal of the program in Manufacturing Simulation and Visualization is to accelerate the development of

Metrology for the Optoelectronics Industry

July 1, 2001

Author(s)

Gordon W. Day

Ultimate Capacities of Low-Rise Steel Frames in Turbulent Wind

July 1, 2001

Author(s)

S Jang, L L. Lu, Fahim H. Sadek, Emil Simiu

This paper is a derivative of G2001-1392, Database-Assisted Wind Load Capacity Estimates for Low-Rise Steel Frames, by Jang, S., et al., intended for

Electron Interactions with c-C4F8

July 1, 2001

Author(s)

Loucas G. Christophorou, James K. Olthoff

Electron, Transport, Ionization and Attachment Coefficients in C2F4 and C2F4/Ar Mixtures

July 1, 2001

Author(s)

Amanda N. Goyettes, G. de Hann, Yicheng Wang, Loucas G. Christophorou, James K. Olthoff

SI Traceability of Force at the Nanonewton Level

July 1, 2001

Author(s)

David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, L. A. Feeney, Edwin R. Williams

Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI)

Novel High-Voltage Range Resistors for Ac-DC Thermal Converters

July 1, 2001

Author(s)

H. O. Wolcott, Joseph R. Kinard Jr., Thomas E. Lipe Jr.

This paper discusses the factors contributing to the ac-dc differences of high-voltage thermal converters. A novel resistor designed to minimize these

Recent Developments in the NIST Cryogenic Thermal Transfer Standard Project

July 1, 2001

Author(s)

Thomas E. Lipe Jr., Joseph R. Kinard Jr., Carl D. Reintsema

We describe the development of a cryogenic thermal transfer standard (CTTS) from the first prototype in 1997 to the present version. A description of the

The Expanding Role of Simulation in Future Manufacturing

July 1, 2001

Author(s)

Charles R. McLean, Swee K. Leong

Simulation technology holds tremendous promise for reducing costs, improving quality, and shortening the timeto- market for manufactured goods. Unfortunately

Influence of Filler Particles and Filler Clusters on Phase Separation in Binary Polymer Blends

July 1, 2001

Author(s)

Y. L. Jiang, A Saxena, T Lookman, Jack F. Douglas

Motivated by recent experiments on filled polymer thin films, we study the effect of the presence of filler particles on phase separating mixtures. using a

Plasma Broadening and Shifts of Non-Hydrogenic Spectral Lines: An Overview of Recent Results

July 1, 2001

Author(s)

N Konjevic, A Lesage, Jeffrey R. Fuhr, Wolfgang L. Wiese

The recent status of the experimental studies of plasma broadening and shifts of non-hydrogenic neutral atom and positive ion spectral lines is reviewed and the

FEA Modeling and Hardness Performance Prediction of Rockwell Diamond Indenters

July 1, 2001

Author(s)

Hui Zhou, Jun-Feng Song, Samuel Low, Li Ma

The difficulty in manufacturing Rockwell diamond indenters to the required geometric specifications has resulted in most commercially manufactured indenters to

Fast and Accurate Characterization of Optical Components Using Low-Coherence Interferometry

July 1, 2001

Author(s)

Shellee D. Dyer, Robert J. Espejo

We show that the dispersion of optical components can be determined from a single low-coherence interferometric measurement. This technique can be applied to

A Capacitance Measurement System Using an Inductive Voltage Divider (IVD) Bridge

July 1, 2001

Author(s)

Bryan C. Waltrip, Andrew D. Koffman, S. Avramov

A new system to characterize the magnitude and phase characteristics of 1 pF to 1 uF capacitance standards over the 50 Hz to 100 kHz frequency range is

Characterization of Paralleled Super Junction MOSFET Devices under Hard- and Soft-Switching Conditions

June 30, 2001

Author(s)

X Huang, H. Yu, Jih-Sheng Lai, Allen R. Hefner Jr., David W. Berning

The super junction (SJ) MOSFET exhibits conduction and switching properties similar to those of conventional power MOSFETs. In this paper we investigate

Silicon Carbide PiN and Merged PiN Schottky Power Diode Models Implemented in the Saber Circuit Simulator

June 30, 2001

Author(s)

Ty R. McNutt, Allen R. Hefner Jr., A. Montooth, J L. Duliere, David W. Berning, Ranbir Singh

Dynamic compact electrothermal models are developed for Silicon Carbide Power diodes. Model parameters are extracted and model results are presented for both

Compensation for Stray Light in Projection Display Metrology

June 30, 2001

Author(s)

Paul A. Boynton, Edward F. Kelley

Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation

A Reference Tristimulus Colorimeter

June 25, 2001

Author(s)

George P. Eppeldauer

The accuracy of tristimulus colorimeters can be increased by using detector standards instead of traditional lamp standards for calibration. After high accuracy

Security - Revenue Generator and Mission Enabler

June 21, 2001

Author(s)

G Stoneburner

We need to facilitate a change in user perception of security from a hindrance to an essential revenue generator and mission enabler. The Common Criteria

Codes and Regulations.

June 18, 2001

Author(s)

J J. Beitel

Armstrong World Industries: Application of Fire Tests

June 18, 2001

Author(s)

T W. Fritz

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