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Conferences

Modeling Linear and Nonlinear Inductive Effects in Superconductiong Planar Circuits

August 1, 2001

Author(s)

James Booth, Christopher L. Holloway, Edward Kuester

Efficient and Accurate Testing of an EMC Compliance Chamber Using an Ultrawideband Measurement System

August 1, 2001

Author(s)

Robert T. Johnk, David R. Novotny, Claude Weil, Marlene Taylor, T. J. O'Hara

This paper summarizes a joint NIST-Industry measurement effort. The purpose of this effort was to use a NIST-developed ultrawideband measurement system to

On the Use of Fitting Models for the Time-Domain Analysis of Problems with Frequency-Dependent Parameters

August 1, 2001

Author(s)

Alberto Scarlatti, M. S. Sarto, Christopher L. Holloway

The use of fitting models in the time-domain analysis of electromagnetic problems is of great interest. The aim of this paper is to describe the main features

Emission and Immunity Standards: Replacing Field-at-a-Distance Measurements with Total-Radiated-Power Measurements

August 1, 2001

Author(s)

Perry F. Wilson, Galen H. Koepke, John M. Ladbury, Christopher L. Holloway

The radiation and reception patterns of devices become more complicated as the measurement frequency is increased. These complicated patterns pose a challenge

Analyzing Broadband Free-Field, Absorber Measurements

August 1, 2001

Author(s)

David R. Novotny, Robert T. Johnk, Arthur Ondrejka

We present and analyze a method for free-field evaluation of broadband absorber in a non-ideal testing environment. Using broadband, short-impulse TEM horns, a

Characterization of Thin and Ultrathin Polymer and Resist Films

August 1, 2001

Author(s)

D L. Goldfarb, Q Lin, M Angelopoulos, Christopher Soles, Eric K. Lin, Wen-Li Wu

The need for a better understanding of the physicochemical properties of radiation-sensitive thin polymer coatings for lithographic applications is driven by

The Art and Science of Lamp Photometry

August 1, 2001

Author(s)

R S. Bergman, Yoshi Ohno

This paper first overviews photometric quantities of lamps - luminous flux, luminous intensity, illuminance, and luminance - and general techniques for

Active Monitoring and Control of Electron-Beam-Induced Contamination

August 1, 2001

Author(s)

Andras Vladar, Michael T. Postek, R Vane

The vacuum systems of all scanning electron microscopes (SEMs), even in the so-called clean instruments, have certain hydrocarbon residues that the vacuum pumps

SEM Sentinel-SEM Performance Measurement System

August 1, 2001

Author(s)

Bradley N. Damazo, Andras Vladar, Alice V. Ling, Alkan Donmez, Michael T. Postek, Crossley E. Jayewardene

This paper describes the design and implementation of a system for monitoring the performance of a critical dimension measurement scanning electron microscope

Properties of Cavity-Backed Slot-Ring Antennas at 95 GHZ

August 1, 2001

Author(s)

Shalva Nolen, Todd E. Harvey, Carl D. Reintsema, Erich N. Grossman

Slot-ring antennas with planar backshorts, designed for operation at 95 GHz, have been fabricated and their properties measured. Using optical lithography, we

Design of an Active MM-Wave Concealed Object Imaging System

August 1, 2001

Author(s)

Nicholas Paulter, Erich N. Grossman, Gerard N. Stenbakken, Bryan C. Waltrip, Shalva Nolen, Carl D. Reintsema

The research and design of an active millimeter-wave concealed object imaging system is described. Several illumination and detection methods were analyzed via

Concealed Weapons Detection System Using Uncooled, Pulsed, Imaging Arrays of Millimeter-Wave Bolometers

August 1, 2001

Author(s)

Erich N. Grossman, Shalva Nolen, Nicholas Paulter, Carl D. Reintsema

We describe a system for detection of concealed weapons based upon imaging the millimeter-wave reflectance contrast between the weapon and the human body. An

Experimental Dynamics of Stressed, Strongly Correlated Plasmas, ed. by F. Anderegg, L. Schweikhard, and C.F. Driscoll

July 30, 2001

Author(s)

T B. Mitchell, John Bollinger, Wayne M. Itano, Daniel H. Dubin

Intercomparisons of the Measurement of Force Among National Metrology Institutes

July 29, 2001

Author(s)

Thomas W. Bartel

A description will be given of the ongoing Comite International des Poids et Measures (CIPM) key comparison programs in force. The participation of the National

Basic Procedures in Force Calibration at NIST

July 29, 2001

Author(s)

Ricky L. Seifarth, Samuel L. Ho

Force calibrations obtainable at the National Institute of Standards and Technology (NIST) continue to focus on extracting the maximum performance from the

The Policy Machine for Security Policy Management

July 17, 2001

Author(s)

Chung Tong Hu, Deborah A. Frincke, David F. Ferraiolo

Many different access controls policies and models have been developed to suit a variety of goals: these include Role-Based Access Control, One-directional

A Framework for Performance Evaluation and Optimization of an Emerging Multimedia DS-CDMA Network

July 10, 2001

Author(s)

Vladimir Marbukh, David H. Su

This paper proposes a framework for performance evaluation md optimization of an emerging multimedia, packet Direct-Sequence Code Division Multiple Access (DS

A History of Testing Heat Insulators at the National Institute of Standards and Technology

July 1, 2001

Author(s)

Robert R. Zarr

The history of testing heat insulators at the National Institute of Standards and Technology (formerly the National Bureau of Standards is nearly as long as the

Temperature-Dependent Behavior of PbSc_1/2Nb_1/2O₃ From First Principles

July 1, 2001

Author(s)

Eric J. Cockayne, Benjamin P. Burton, L Bellaiche

We study the ferroelectric phase transition in PbSc1/2Nb1/2O3 (PSN) using a first-principles effective Hamiltonian approach. Results for PSN with NaCl-type

A Genetic Programming System with a Procedural Program Representation

July 1, 2001

Author(s)

John G. Hagedorn, J E. Devaney

We describe the status of a genetic programming system that is based on a procedural program representation. The procedural representation is closely related to

What to Expect When You Can Not Start at the Beginning

July 1, 2001

Author(s)

David E. Cypher

This presentation contains background information on the decision to create an Specification and Description Language (SDL) model, a discussion of the

CDMA2000 Reverse-Link Simulation Model Design and Evaluation

July 1, 2001

Author(s)

Hamid Gharavi, R Wyatt-Millington, F Chin

This paper presents the design and implementation of a simulation model for the cdma2000 reverse link. The model includes all the radio configurations and their

Simulations of Filled Polymers on Multiple Length Scales

July 1, 2001

Author(s)

Francis W. Starr, S C. Glotzer

We present simulation results of the effect of nanoscopic and micron-sized fillers on the structure, dynamics, and mechanical properties of polymer melts and

FEA Modeling and Hardness Performance Prediction of Rockwell Diamond Indenters

July 1, 2001

Author(s)

Li Ma, J Zhou, Samuel R. Low III, Jun-Feng Song

The difficulty in manufacturing Rockwell diamond indenters to the required geometric specifications has resulted in most commercially manufactured indenters to

DTA/TGA Study of Eutectic Melting in the System BaF₂-BaO-Y₂O₃-CuO_x-H₂O

July 1, 2001

Author(s)

Lawrence P. Cook, Winnie K. Wong-Ng, J Suh

Differential thermal analysis and thermogravimetric analysis (DTA/TGA) experiments have been completed in the BaF2-BaO-Y2O3-CuOx-H2O system at various oxygen

An Introduction to the Phase-Field Method: Simulation of Alloy Solidification

July 1, 2001

Author(s)

William J. Boettinger, James A. Warren, C Beckermann, A N. Karma

An overview of the phase-field method for modeling alloy solidification is presented together with several example results. Using a phase-field variable and a

The Significance of Percolation on the Dynamics of Polymer Chains Bound to Carbon Black

July 1, 2001

Author(s)

A Nakatani, R Ivkov, P Papanek, C L. Jackson, H Yang, L T. Nikiel, M Gerspacher

Neutron time-of-flight (TOF) spectroscopy is used to compare the chain dynamics of pure polyisoprene with polyisoprene bound to the surface of various grades of

NIST Role in Radiometric Calibrations for Remote Sensing Programs at NASA, NOAA, DOE and DOD

July 1, 2001

Author(s)

Albert C. Parr, Raju V. Datla

The Optical Technology Division (OTD) at the National Institute of Standards and Technology (NIST) has been actively involved in providing calibration support

Modeling Technology for a Model-Intensive Enterprise

July 1, 2001

Author(s)

Michael Gruninger, David W. Flater, Peter O. Denno

The Object Management Group (OMGtm) is defining specifications supporting a modeling environment that permits models from a family of modeling languages to

Single-Integral-Equation Method for Scattering by Dielectric Cylinders

July 1, 2001

Author(s)

Egon Marx

Electromagnetic scattering of an incident plane monochromatic wave by dielectric or finitely conducting infinite cylinders of arbitrary shape, possibly in the

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