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Conferences

Sapphire Statistical Characterization and Risk Reduction Program

Author(s)
D R. McClure, R W. Cayse, David R. Black, S M. Goodrich, K Peter, D Lagerloef, D C. Harris, D McCullum, D H. Platus, C E. Patty, Robert S. Polvani
The Sapphire Statistical Characterization and Risk Reduction Program tested 1400 4-point flexure bars with different crystal orientations at different...

NISURF-II, An Upgraded Surface Measuring Facility

Author(s)
S Z. Zahwi, M F. Koura, Thomas Brian Renegar, A M. Mekawi
During 1982-1985, a cooperative project was made between the National Bureau of Standards (NBS) at that time (now National Institute of Standards and Technology...

Wavelength Calibration Standards for the WDM L-Band

Author(s)
William C. Swann, Sarah L. Gilbert
We describe National Institute of Standards and Technology research on wavelength standards for the optical communications L-band. We are developing a pair of...

Progress Towards Arrays of Microcalorimeter X-ray Detectors

Author(s)
Sae Woo Nam, David A. Wollman, Dale Newbury, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis
The high performance of single-pixel microcalorimeter EDS (υcal EDS) has been shown to be very useful for a variety of microanalysis cases. The primary...

Single Molecule Probes

Author(s)
Lori S. Goldner, K D. Weston, W F. Heinz, Jeeseong Hwang, E S. DeJong, John P. Marino
The technology to rapidly manipulate and screen individual molecules lies at the frontier of measurement science and impacts emerging bio- and nano-technologies...

Building Integrated Photovoltaic Test Facility

Author(s)
Arthur H. Fanney, Brian P. Dougherty
The widespread use of building integrated photovoltaics appears likely as a result of the continuing decline in photovoltaic manufacturing costs, the relative...

Interferometric Testing of Photomask Substrate Flatness

Author(s)
Christopher J. Evans, R E. Parks, L Z. Shao, Tony L. Schmitz, Angela Davies
Conventional interferometric testing of the flatness of photomask blanks is rendered difficult by the long coherence length of the HeNe laser sources typically...

Electronic Display Metrology--Not a Simple Matter

Author(s)
Edward F. Kelley
Most would assume that the characterization of electronic display quality would be a straightforward process offering few complications. However, what the eye...

Understanding TREC Results - the Role of Statistics

Author(s)
Walter S. Liggett Jr, Paul D. Over
The challenge in empirical development of information retrieval systems at TREC is obtaining general conclusions from IR system responses to a sample of perhaps...

Total Luminous Flux Calibrations of LEDs at NIST

Author(s)
Carl C. Miller, Yoshihiro Ohno
The total luminous flux (lumen) is one of the most important characteristics of Light Emitting Diodes (LEDs), and is commonly measured using integrating sphere...

Absolute Extreme Ultraviolet Metrology

Author(s)
Charles S. Tarrio, Robert E. Vest, S Grantham
NIST has a long-standing program for the calibration of extreme ultraviolet optical components. Begun with the advent of the Synchrotron Ultraviolet Radiation...

Elimation of Intensity Noise at SURF III

Author(s)
Uwe Arp, K Harkay, K Kim, Thomas B. Lucatorto
Most applications of synchrotron radiation are not very sensitive to source intensity fluctuations. Fourier-transform spectroscopy, however, is very sensitive...
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