Most would assume that the characterization of electronic display quality would be a straightforward process offering few complications. However, what the eye sees can be very difficult to capture accurately and quickly in a meaningful way. With the advent of many new display technologies, there is a need for a level playing field so that different technologies can be compared on an equivalent basis. Orchestrating display metrology to accomplish this is wrought with several difficulties that will be reviewed especially in the areas of stray light management/measurement and meaningful reflection characterization.
Proc. Intl. Soc. for Optical Engineering (SPIE)Symp. on Harnessing Light, Optical Science and Metrology at NIST
Electronic Display Metrology--Not a Simple Matter, Proc. Intl. Soc. for Optical Engineering (SPIE)Symp. on Harnessing Light, Optical Science and Metrology at NIST, San Diego, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=23772
(Accessed December 6, 2023)