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Electronic Display Metrology--Not a Simple Matter

Published

Author(s)

Edward F. Kelley

Abstract

Most would assume that the characterization of electronic display quality would be a straightforward process offering few complications. However, what the eye sees can be very difficult to capture accurately and quickly in a meaningful way. With the advent of many new display technologies, there is a need for a level playing field so that different technologies can be compared on an equivalent basis. Orchestrating display metrology to accomplish this is wrought with several difficulties that will be reviewed especially in the areas of stray light management/measurement and meaningful reflection characterization.
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE)Symp. on Harnessing Light, Optical Science and Metrology at NIST
Conference Location
San Diego, CA

Keywords

display metrology, haze, reflection measurements, stray light, veiling glare

Citation

Kelley, E. (2001), Electronic Display Metrology--Not a Simple Matter, Proc. Intl. Soc. for Optical Engineering (SPIE)Symp. on Harnessing Light, Optical Science and Metrology at NIST, San Diego, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=23772 (Accessed June 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 1, 2001, Updated February 19, 2017