Zahwi, S.
, Koura, M.
, Renegar, T.
and Mekawi, A.
(2001),
NISURF-II, An Upgraded Surface Measuring Facility, International Symposium on Metrology and Quality Control, Cairo, 1, EG (Accessed April 27, 2026)
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NISURF-II, An Upgraded Surface Measuring Facility
Published
Author(s)
S Z. Zahwi, M F. Koura, , A M. Mekawi
Abstract
During 1982-1985, a cooperative project was made between the National Bureau of Standards (NBS) at that time (now National Institute of Standards and Technology (NIST - USA)) and the National Institute for Standards (NIS - Egypt) to establish a computerized surface measuring system that could be used to calibrate roughness specimens for the service of the industrial sector in Egypt. The system was successfully established and was named NISURF-I. The system consisted of a stylus instrument, interfaced to a microcomputer running in the HP BASIC environment, which controlled a digital voltmeter data acquisition unit through a general purpose interface bus (GPIB). This system served the industrial applications till 1999. In 1999 it was decided to upgrade the old system using newer technologies. The system upgrade has been supported by a second cooperative program between NIST and NIS that started in 1999.Conference Dates
September 24-27, 2001
Conference Location
Cairo, 1, EG
Conference Title
International Symposium on Metrology and Quality Control
Pub Type
Conferences
Keywords
calibration, roughness, software, stylus instrument
Citation
Issues
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Created August 31, 2001, Updated October 12, 2021