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Conferences

Single Molecule Probes

Author(s)
Lori S. Goldner, K D. Weston, W F. Heinz, Jeeseong Hwang, E S. DeJong, John P. Marino
The technology to rapidly manipulate and screen individual molecules lies at the frontier of measurement science and impacts emerging bio- and nano-technologies

Building Integrated Photovoltaic Test Facility

Author(s)
Arthur H. Fanney, Brian P. Dougherty
The widespread use of building integrated photovoltaics appears likely as a result of the continuing decline in photovoltaic manufacturing costs, the relative

Interferometric Testing of Photomask Substrate Flatness

Author(s)
Christopher J. Evans, R E. Parks, L Z. Shao, Tony L. Schmitz, Angela Davies
Conventional interferometric testing of the flatness of photomask blanks is rendered difficult by the long coherence length of the HeNe laser sources typically

Electronic Display Metrology--Not a Simple Matter

Author(s)
Edward F. Kelley
Most would assume that the characterization of electronic display quality would be a straightforward process offering few complications. However, what the eye

Understanding TREC Results - the Role of Statistics

Author(s)
Walter S. Liggett Jr, Paul D. Over
The challenge in empirical development of information retrieval systems at TREC is obtaining general conclusions from IR system responses to a sample of perhaps

Total Luminous Flux Calibrations of LEDs at NIST

Author(s)
Carl C. Miller, Yoshihiro Ohno
The total luminous flux (lumen) is one of the most important characteristics of Light Emitting Diodes (LEDs), and is commonly measured using integrating sphere

Absolute Extreme Ultraviolet Metrology

Author(s)
Charles S. Tarrio, Robert E. Vest, S Grantham
NIST has a long-standing program for the calibration of extreme ultraviolet optical components. Begun with the advent of the Synchrotron Ultraviolet Radiation

Elimation of Intensity Noise at SURF III

Author(s)
Uwe Arp, K Harkay, K Kim, Thomas B. Lucatorto
Most applications of synchrotron radiation are not very sensitive to source intensity fluctuations. Fourier-transform spectroscopy, however, is very sensitive

Radiometry of Low-Pressure Hg-Ar Discharges

Author(s)
Craig J. Sansonetti, Joseph Reader
New fluorescent lamp designs employ Hg-Ar discharges under operating conditions that differ significantly from those found in conventional fluorescent tubes. We

Electric Force Microscopy with a Single Carbon Nanotube Tip

Author(s)
John A. Dagata, F S. Chien, S Gwo, K Morimoto, T Inoue, J Itoh, H Yokoyama
Carbon nanotube tips offer a significant improvement over standard scanned probe microscope (SPM) tips for electrical characterization of nanodevice structures

Silicon Single Atom Steps as AFM Height Standards

Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, V W. Tsai, E. C. Williams, Theodore V. Vorburger, H Edwards, D Cook, P West, R Nyffenegger
Atomic force microscopes (AFMs) are used in the semiconductor industry for a variety of metrology purposes. Step height measurements at the nanometer level and

Publication and Use of Large Data Sets

Author(s)
J R. Rumble
Scientific information comes in many sizes, types and quality. Because of diversity of the scientific information being published, different issues will arise
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