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Conferences

Self-Energy Screening in Two-Electron Ions

Author(s)
Paul Indelicato, Peter Mohr
The self-energy screening correction to the Coulomb part of the electron-electron interaction (self-energy screening) is evaluated. We consider only the...

The Philosophy of Information Retrieval Evaluation

Author(s)
Ellen M. Voorhees
Evaluation conferences such as TREC, CLEF, and NTCIR are modern examples of the Cranfield evaluation paradigm. In the Cranfield paradigm, researchers perform...

Sub-dekahertz spectroscopy of 199Hg+

Author(s)
J. C. Bergquist, R J. Rafac, B. A. Young, James A. Beall, Wayne M. Itano, David J. Wineland
Using a laser that is frequency locked to a Fabry-Perot etalon of high finesse and stability, we probe the 5d 106s 2S = (F=0, m f=0) 5d 96s 2 2 d5/2 (F=2, m f=0...

Microdisplay Metrology Research at NIST

Author(s)
Paul A. Boynton
Measuring the optical characteristics of a microdisplay produces challenges to traditional display metrology. When using light-measuring devices to measure...

A Mercury-Ion Optical Clock

Author(s)
James C. Bergquist, U Tanaka, Robert E. Drullinger, Wayne M. Itano, David J. Wineland, Scott A. Diddams, Leo W. Hollberg, E A. Curtis, Christopher W. Oates, T Udem

Object Identification Using Bar Codes Based on LADAR Intensity

Author(s)
William C. Stone, Geraldine S. Cheok, K M. Furlani, David E. Gilsinn
Tests of a novel concept for tracking construction components were carried out at the National Institute of Standards and Technology. The approach makes use of...

Speaker Recognition in a Multi-Speaker Environment

Author(s)
Alvin F. Martin, Mark A. Przybocki
We discuss the multi-speaker tasks of detection, tracking, and segmentation of speakers as included in recent NIST Speaker Recognition Evaluations. We consider...

Effects of Wafer Emissivity on Light-Pipe Rediometry in RTP Tools

Author(s)
Kenneth G. Kreider, David W. Allen, D H. Chen, D P. DeWitt, Christopher W. Meyer, Benjamin K. Tsai
We investigated the effect of different wafer emissivities and the effect of low emissivity films on rapid thermal processing (RTP) wafer temperature...
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