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Conferences

Physical Degradation Of Polymeric Coating Surfaces Using Atomic Force Microscopy

November 1, 2001

Author(s)

Mark R. VanLandingham, M Giraud, Tinh Nguyen, Walter E. Byrd, Jonathan W. Martin

Atomic force microscopy (AFM) and Fourier Transform Infrared (FTIR) spectroscopy were used to monitor physical and chemical changes, respectively, in acrylic...

A 2.4mm Coaxial Power Standard at NIST

November 1, 2001

Author(s)

Thomas P. Crowley, Fred R. Clague

A microcalorimeter and bolometer transfer standard are used as a national standard for microwave power from 50 MHz to 50 GHz. the microcalorimeter is used to...

Performance of the Bluetooth System in Fading Dispersive Channels and Interference

November 1, 2001

Author(s)

R E. Van dyck, A Soltarian

A noncoherent limiter-discriminator receiver is often considered for the Bluetooth system because of its simplicity and low cost. While its performance is more...

Interference Aware Bluetooth Packet Scheduling

November 1, 2001

Author(s)

Nada T. Golmie, Nicolas Chevrollier, I El bakkouri

Bluetooth is a radio technology for Wireless Personal Area Networks operating in the 2.4 GHz ISM band. Since both Bluetooth and IEEE 802.11 devices use the same...

X-Ray Spectra in the 12- to 60- keV Energy Range From Plasmas Produced by the OMEGA Laser

November 1, 2001

Author(s)

J Seely, R Deslattes, Lawrence T. Hudson, G Holland, R Atkin, D D. Meyerhofer, C Stoeckl

X-ray spectra in the energy range (12 to 60) keV were recorded by a transmission crystal spectrometer from targets irradiated by the 60 beam, difference} 30 kJ...

Nanomachining of Si with Si3N4 Masks Patterned by Scanning

November 1, 2001

Author(s)

F S. Chien, John A. Dagata, W F. Hsieh, S Gwo

We demonstrate that local oxidation of silicon nitride films deposited on conductive substrates with a conductive-probe atomic force microscope (AFM) is a very...

Wire Bond Temperature Sensor

November 1, 2001

Author(s)

Shivesh Shuman, Michael Gaitan, Yogendra K. Joshi, George G. Harman

Wire Bonding to Advanced Copper-Low-K Integrated Circuits, the Metal/Dielectric Stacks, and Materials Considerations

November 1, 2001

Author(s)

George G. Harman, C E. Johnson

There are three areas to consider when planning to wire bond to new chips having copper bond pads and low dielectric-constant polymers imbedded beneath them (Cu...

Real-Time Operating System Timing Jitter and its Impact on Motor Control

October 29, 2001

Author(s)

Frederick M. Proctor, William P. Shackleford

General-purpose microprocessors are increasingly being used for control applications due to their widespread availability and software support for non-control...

Why You Should Be Interested in Technology Roadmaps for Compound Semiconductors

October 21, 2001

Author(s)

Herbert S. Bennett

Unlike the silicon semiconductor industry, the compound semiconductor industry does not have an international consensus for a few selected applications and...

Time-Domain Measurement System to Characterize Ultrawideband Emissions

October 21, 2001

Author(s)

Robert T. Johnk, David R. Novotny

This paper summarizes some results of a recent NIST measurement effort. The purpose of this effort was to use a NSIT-developed ultrawideband measurement system...

Latent Reliability Degradation of Ultra-Thin Oxides after Heavy Ion and Gamma Ray Irradiation

October 18, 2001

Author(s)

Bin Wang, John S. Suehle, Eric M. Vogel, J. R. Conley, C E. Weintraub, A. H. Johnston, J B. Bernstein

We studied the effects of heavy ion and gamma ray irradiation on radiation-induced leakage current (RILC) and time-dependent dielectric breakdown (TDDB) life...

RF Materials Characterization Metrology at NBS/NIST: Past and Recent Work, Future Directions and Challenges

October 14, 2001

Author(s)

James R. Baker-Jarvis

This paper is an overview on the RF materials characterization metrology at NBS/NIST. Over the years, measurements on the electrical permittivity and...

Electrode Effects Revisited

October 14, 2001

Author(s)

Ken L. Stricklett, James R. Baker-Jarvis

Government Activity to Increase Benefits from the Global Standards System

October 3, 2001

Author(s)

Roger Marks, Robert E. Hebner

The economic development of the Twentieth Century was accompanied and enhanced by the increasing use of documentary standards, largely developed by industry. In...

A New Broadband RF Field Standard Using a Coaxial Transmission Line of Conical Geometry: Progress Report

October 1, 2001

Author(s)

Claude Weil, David R. Novotny, Robert T. Johnk, Arthur Ondrejka

We discuss progress in developing a new broadband (10MHz to 40MHz) RF field standard to be used for calibrating small electromagnetic field probes. The...

Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines

October 1, 2001

Author(s)

Uwe Arz, Dylan Williams, Hartmut Grabinski

We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy...

De la Pate de Ciment au Beton: Modlisation et Mesures Exprimentales des Proprietes Rhologiques. [Cement Paste to the Concrete Modisation and Measure Experimental of the Properties Rheology.]

October 1, 2001

Author(s)

Chiara F. Ferraris, Nicos Martys

The prediction of concrete rheological properties is essential for the correct use of the material. The composition of the concrete is nowadays complex. It is...

Using Finite Element Analysis to Design a New Guarded Hot Plate Apparatusfor Measuring the Thermal Conductivity of Insulating Materials

October 1, 2001

Author(s)

William M. Healy

The National Institute of Standards and Technology (NIST) is developing aguarded hot plate apparatus to measure the thermal conductivity of thermal insulation...

Multispectral Probes for Materials and Chemical Analysis

October 1, 2001

Author(s)

Steven A. Buntin

High throughput experimentation is currently restricted by its limited ability to evaluate more than one parameter of a library at a time (e.g., chemical...

Luminous Intensity of LEDs at NIST

October 1, 2001

Author(s)

Carl C. Miller, Yoshihiro Ohno

Calibration facilities and procedures for measurement of Averaged LED intensity using the detector-based method have been developed at the National Institute of...

Modeling the Appearance of Special Effect Pigment Coatings

October 1, 2001

Author(s)

Thomas A. Germer, Maria E. Nadal

Metallic and pearlescent coatings are becoming increasingly important in automotive, currency, and cosmetic applications. These coatings consist of metallic or...

Accuracy and Versatility of the NIST M48 Coordinate Measuring Machine

October 1, 2001

Author(s)

John R. Stoup, Theodore D. Doiron

The NIST Is continuing to develop the ability to perform accurate, traceable measurements on a wide range of artifacts using a very precise, error-mapped...

Some Developments at NIST on Traceability in Dimensional Measurements

October 1, 2001

Author(s)

Dennis A. Swyt, Steven D. Phillips, J Palmateer

This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of...

NIST Program on Relative Intensity Noise Standards for Optical Fiber Sources Near 1550 nm

October 1, 2001

Author(s)

Gregory E. Obarski

Laboratory and transfer standards are developed for the relative intensity noise (RIN) of optical fiber sources in the 1550 nm range. Herein RIN denotes the...

Generalized Pressure Drop Correlation for Evaporation and Condensation in Smooth and Micro-Fin Tubes

October 1, 2001

Author(s)

J Y. Choi, Mark A. Kedzierski, Piotr A. Domanski

This paper presents a pressure drop correlation for evaporation and condensation in smooth and micro-fin tubes. The correlation was developed from a data base...

Time- and Frequency-Domain Analysis of EMC Test Facilities

October 1, 2001

Author(s)

David R. Novotny, Robert T. Johnk, Claude Weil, Seturnino Canales

We have developed a methodology to determine the quality of an EMC test facility using equipment that may be generally available to RF testing services. By...

High Current Sic JBS Diode Characterization for Hard- and Soft-switching Applications

October 1, 2001

Author(s)

Jih-Sheng Lai, X Huang, H. Yu, Allen R. Hefner Jr., David W. Berning, Ranbir Singh

Test-Chamber Imaging Using Spherical Near-Field Scanning

October 1, 2001

Author(s)

Ronald C. Wittmann, Michael H. Francis

Although the theory is straightforward, practical implementation of spherical near-field scanning for evaluating test chambers presents some significant...

Techniques to Improve Bluetooth Performance in Interference Environments

October 1, 2001

Author(s)

Nada T. Golmie, Nicolas Chevrollier

Bluetooth is a radio technology for Wireless Personal Area Networks operating in the 2.4 GHz ISM band. Since both Bluetooth and IEEE 802.11 devices use the same...

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