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Conferences

Object Identification Using Bar Codes Based on LADAR Intensity

Author(s)
William C. Stone, Geraldine S. Cheok, K M. Furlani, David E. Gilsinn
Tests of a novel concept for tracking construction components were carried out at the National Institute of Standards and Technology. The approach makes use of

Speaker Recognition in a Multi-Speaker Environment

Author(s)
Alvin F. Martin, Mark A. Przybocki
We discuss the multi-speaker tasks of detection, tracking, and segmentation of speakers as included in recent NIST Speaker Recognition Evaluations. We consider

Effects of Wafer Emissivity on Light-Pipe Rediometry in RTP Tools

Author(s)
Kenneth G. Kreider, David W. Allen, D H. Chen, D P. DeWitt, Christopher W. Meyer, Benjamin K. Tsai
We investigated the effect of different wafer emissivities and the effect of low emissivity films on rapid thermal processing (RTP) wafer temperature

Sapphire Statistical Characterization and Risk Reduction Program

Author(s)
D R. McClure, R W. Cayse, David R. Black, S M. Goodrich, K Peter, D Lagerloef, D C. Harris, D McCullum, D H. Platus, C E. Patty, Robert S. Polvani
The Sapphire Statistical Characterization and Risk Reduction Program tested 1400 4-point flexure bars with different crystal orientations at different

NISURF-II, An Upgraded Surface Measuring Facility

Author(s)
S Z. Zahwi, M F. Koura, Thomas Brian Renegar, A M. Mekawi
During 1982-1985, a cooperative project was made between the National Bureau of Standards (NBS) at that time (now National Institute of Standards and Technology

Wavelength Calibration Standards for the WDM L-Band

Author(s)
William C. Swann, Sarah L. Gilbert
We describe National Institute of Standards and Technology research on wavelength standards for the optical communications L-band. We are developing a pair of

Progress Towards Arrays of Microcalorimeter X-ray Detectors

Author(s)
Sae Woo Nam, David A. Wollman, Dale Newbury, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis
The high performance of single-pixel microcalorimeter EDS (υcal EDS) has been shown to be very useful for a variety of microanalysis cases. The primary
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