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Conferences

Luminous Intensity of LEDs at NIST

Author(s)
Carl C. Miller, Yoshihiro Ohno
Calibration facilities and procedures for measurement of Averaged LED intensity using the detector-based method have been developed at the National Institute of

Time- and Frequency-Domain Analysis of EMC Test Facilities

Author(s)
David R. Novotny, Robert T. Johnk, Claude Weil, Seturnino Canales
We have developed a methodology to determine the quality of an EMC test facility using equipment that may be generally available to RF testing services. By

Self-Energy Screening in Two-Electron Ions

Author(s)
Paul Indelicato, Peter Mohr
The self-energy screening correction to the Coulomb part of the electron-electron interaction (self-energy screening) is evaluated. We consider only the

The Philosophy of Information Retrieval Evaluation

Author(s)
Ellen M. Voorhees
Evaluation conferences such as TREC, CLEF, and NTCIR are modern examples of the Cranfield evaluation paradigm. In the Cranfield paradigm, researchers perform

Sub-dekahertz spectroscopy of 199Hg+

Author(s)
J. C. Bergquist, R J. Rafac, B. A. Young, James A. Beall, Wayne M. Itano, David J. Wineland
Using a laser that is frequency locked to a Fabry-Perot etalon of high finesse and stability, we probe the 5d 106s 2S = (F=0, m f=0) 5d 96s 2 2 d5/2 (F=2, m f=0

Microdisplay Metrology Research at NIST

Author(s)
Paul A. Boynton
Measuring the optical characteristics of a microdisplay produces challenges to traditional display metrology. When using light-measuring devices to measure

A Mercury-Ion Optical Clock

Author(s)
James C. Bergquist, U Tanaka, Robert E. Drullinger, Wayne M. Itano, David J. Wineland, Scott A. Diddams, Leo W. Hollberg, E A. Curtis, Christopher W. Oates, T Udem
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