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Conferences

Microdisplay Metrology Research at NIST

Author(s)
Paul A. Boynton
Measuring the optical characteristics of a microdisplay produces challenges to traditional display metrology. When using light-measuring devices to measure

A Mercury-Ion Optical Clock

Author(s)
James C. Bergquist, U Tanaka, Robert E. Drullinger, Wayne M. Itano, David J. Wineland, Scott A. Diddams, Leo W. Hollberg, E A. Curtis, Christopher W. Oates, T Udem

Speaker Recognition in a Multi-Speaker Environment

Author(s)
Alvin F. Martin, Mark A. Przybocki
We discuss the multi-speaker tasks of detection, tracking, and segmentation of speakers as included in recent NIST Speaker Recognition Evaluations. We consider

Effects of Wafer Emissivity on Light-Pipe Rediometry in RTP Tools

Author(s)
Kenneth G. Kreider, David W. Allen, D H. Chen, D P. DeWitt, Christopher W. Meyer, Benjamin K. Tsai
We investigated the effect of different wafer emissivities and the effect of low emissivity films on rapid thermal processing (RTP) wafer temperature

Object Identification Using Bar Codes Based on LADAR Intensity

Author(s)
William C. Stone, Geraldine S. Cheok, K M. Furlani, David E. Gilsinn
Tests of a novel concept for tracking construction components were carried out at the National Institute of Standards and Technology. The approach makes use of

Sapphire Statistical Characterization and Risk Reduction Program

Author(s)
D R. McClure, R W. Cayse, David R. Black, S M. Goodrich, K Peter, D Lagerloef, D C. Harris, D McCullum, D H. Platus, C E. Patty, Robert S. Polvani
The Sapphire Statistical Characterization and Risk Reduction Program tested 1400 4-point flexure bars with different crystal orientations at different
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