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A Method of Developing Frequency-Domain Models for Nonlinear Circuits Based on Large-Signal Measurements

Published

Author(s)

Jeffrey Jargon, Kuldip Gupta, Dominique Schreurs, Kate Remley, Donald C. DeGroot

Abstract

This paper describes a method of generating models for nonlinear devices and circuits, based upon measurements of traveling-wave voltages at a periodic large-signal excitation and its harmonics using a nonlinear vector network analyzer. Utilizing a second source, multiple measurements of a nonlinear circuit are used to train artificial neural network models that yield portable, nonlinear large-signal scattering parameter models. An independent check is achieved by comparing an example diode circuit model generated using this methodology with a harmonic balance simulation.
Conference Dates
November 29-30, 2001
Conference Location
San Diego, CA, USA
Conference Title
58th Auto. RF Tech. Group Conference

Keywords

artificial neural network, frequency-domain, large-signal, measurement, model, nonlinear

Citation

Jargon, J. , Gupta, K. , Schreurs, D. , Remley, K. and DeGroot, D. (2001), A Method of Developing Frequency-Domain Models for Nonlinear Circuits Based on Large-Signal Measurements, 58th Auto. RF Tech. Group Conference, San Diego, CA, USA (Accessed April 13, 2024)
Created November 28, 2001, Updated October 12, 2021