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Conferences

Energy Dispersive X-ray Analysis using a Microcalorimeter Detector

Author(s)
W. Harris, L. Le Tarte, H. Bakhru, W. Gibson, D. Wu, Robert E. Geer, David A. Wollman
Energy dispersive X-ray analysis (EDX) is widely used within the semiconductor community for chemical analysis and identification of features observed in

Recent Advances in Flame Retardant Polymer Nanocomposites

Author(s)
Jeffrey W. Gilman, Takashi Kashiwagi, A B. Morgan, Richard H. Harris Jr., L D. Brassell, W H. Awad, Rick D. Davis, L Chyall, T E. Sutto, Paul C. Trulove, H DeLong
A new approach to address the ever increasing demand for higher performance flame retarded products has recently focused on use of mica-type clays nano

Improved Range Resistors for AC-DC Transfer Measurements

Author(s)
H. O. Wolcott, Joseph R. Kinard Jr., Thomas E. Lipe Jr.
This paper discusses the factors contributing to the ac-dc differences of high-voltage thermal converters. A novel resistor designed to minimize these

Toxic Yield

Author(s)
William M. Pitts
It is generally recognized that the vast majority of deaths associated with accidental enclosure fires are due to smoke inhalation. Older reviews of autopsy

Regenerative Stablity Analysis of Highly Interrupted Machining

Author(s)
Matthew A. Davies, Jon R. Pratt, Brian S. Dutterer, Timothy J. Burns
We discuss theoretical and experimental work that supports the use of very low radia immersion in the high-speed milling of difficult-to-machine materials, such

Molecular Measuring Machine Design and Performance

Author(s)
John A. Kramar, Jay S. Jun, William B. Penzes, Vincent P. Scheuerman, Fredric Scire, E C. Teague
We have developed a metrology instrument called the Molecular Measuring Machine (M3) with the goal of performing two-dimensional point-to-point measurements

Neolithography Consortium: A Progress Report

Author(s)
James E. Potzick
The role of process simulation is becoming an increasingly important part of microlithography process control and photomask metrology as wafer feature sizes

A Careful Consideration of the Calibration Concept

Author(s)
Steven D. Phillips, William T. Estler, Theodore D. Doiron, K Eberhardt, M. Levenson
This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under

Single-frequency and Mode-locked Er/Yb Co-doped Waveguide Lasers

Author(s)
Berton Callicoatt, John B. Schlager, Kevin L. Silverman, Robert K. Hickernell, Richard P. Mirin, Norman A. Sanford, Joseph S. Hayden, Samuel D. Conzone, Robert D. Simpson
We present results for single-frequency and mode-locked Er/Yb co-doped waveguide lasers. The single-frequency DBR waveguide lasers have output power in excess

Wavelength standards for optical communications

Author(s)
Sarah L. Gilbert, William C. Swann, Tasshi Dennis
We review wavelength accuracy and calibration issues for wavelength division multiplexed (WDM) optical fiber communication and describe our work on wavelength

Effects of Cleaning on the US Prototype Kilograms

Author(s)
Zeina J. Kubarych, R S. Davis
This paper dicusses the stability of national prototype kilograms No. 4 and No. 20, belonging to the United States. Calibration history, changes in mass with