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W. Harris, L. Le Tarte, H. Bakhru, W. Gibson, D. Wu, Robert E. Geer, David A. Wollman
Energy dispersive X-ray analysis (EDX) is widely used within the semiconductor community for chemical analysis and identification of features observed in
Richard D. Peacock, Richard W. Bukowski, Paul A. Reneke, Jason D. Averill, S. H. Markos
U.S. passenger train fire safety has historically been addressed primarily through the citation of small-scale flammability and smoke emission tests and
Jeffrey W. Gilman, Takashi Kashiwagi, A B. Morgan, Richard H. Harris Jr., L D. Brassell, W H. Awad, Rick D. Davis, L Chyall, T E. Sutto, Paul C. Trulove, H DeLong
A new approach to address the ever increasing demand for higher performance flame retarded products has recently focused on use of mica-type clays nano
2-aminopurine is a highly fluorescent analog of adenine that can be incorporated synthetically into DNA with little perturbation of the native double-helical
While Coulomb-Blockade devices have shown promise as qubit systems or qubit state detectors, large scale parallelization of these devices is severely hampered
It is generally recognized that the vast majority of deaths associated with accidental enclosure fires are due to smoke inhalation. Older reviews of autopsy
Fundamental standards of current and capacitance based on the transfer of electrons one-by-one are described. The current status of several schemes for
Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation
Matthew A. Davies, Jon R. Pratt, Brian S. Dutterer, Timothy J. Burns
We discuss theoretical and experimental work that supports the use of very low radia immersion in the high-speed milling of difficult-to-machine materials, such
John A. Kramar, Jay S. Jun, William B. Penzes, Vincent P. Scheuerman, Fredric Scire, E C. Teague
We have developed a metrology instrument called the Molecular Measuring Machine (M3) with the goal of performing two-dimensional point-to-point measurements
The dielectric permittivity and impedance characteristics were evaluated for high-dielectric constant polymer composite films, that are being developed by the
The role of process simulation is becoming an increasingly important part of microlithography process control and photomask metrology as wafer feature sizes
Steven D. Phillips, William T. Estler, Theodore D. Doiron, K Eberhardt, M. Levenson
This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under
This paper summarizes the definitions and properties of frequency and time variance estimators based on the "total" approach. These definitions and properties
Berton Callicoatt, John B. Schlager, Kevin L. Silverman, Robert K. Hickernell, Richard P. Mirin, Norman A. Sanford, Joseph S. Hayden, Samuel D. Conzone, Robert D. Simpson
We present results for single-frequency and mode-locked Er/Yb co-doped waveguide lasers. The single-frequency DBR waveguide lasers have output power in excess
As the theme of this year''s International Dimensional Metrology Workshop is Dimensional Metrology - Precision Measurements in the New Millennium, it is
We review wavelength accuracy and calibration issues for wavelength division multiplexed (WDM) optical fiber communication and describe our work on wavelength
This paper dicusses the stability of national prototype kilograms No. 4 and No. 20, belonging to the United States. Calibration history, changes in mass with