Keller, M.
(2001),
Standards of Current and Capacitance Based on Single-Electron Tunneling Devices, Recent Advances in Metrology and Fundamental Constants - Fermi School CXLVI, Varenna, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33098
(Accessed October 12, 2025)
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Standards of Current and Capacitance Based on Single-Electron Tunneling Devices
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Abstract
Fundamental standards of current and capacitance based on the transfer of electrons one-by-one are described. The current status of several schemes for realizing such standards is reviewed. The impact of these standards on metrology and fundamental constants is discussed.Proceedings Title
Recent Advances in Metrology and Fundamental Constants - Fermi School CXLVI
Conference Dates
July 21-August 6, 2001
Conference Location
Varenna, IT
Pub Type
Conferences
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Keywords
capacitance standard, current standard, quantum metrology triangle, single-electron tunneling
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Created January 1, 2001, Updated January 27, 2020