Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Standards of Current and Capacitance Based on Single-Electron Tunneling Devices

Published

Author(s)

Mark W. Keller

Abstract

Fundamental standards of current and capacitance based on the transfer of electrons one-by-one are described. The current status of several schemes for realizing such standards is reviewed. The impact of these standards on metrology and fundamental constants is discussed.
Proceedings Title
Recent Advances in Metrology and Fundamental Constants - Fermi School CXLVI
Conference Dates
July 21-August 6, 2001
Conference Location
Varenna, IT

Keywords

capacitance standard, current standard, quantum metrology triangle, single-electron tunneling

Citation

Keller, M. (2001), Standards of Current and Capacitance Based on Single-Electron Tunneling Devices, Recent Advances in Metrology and Fundamental Constants - Fermi School CXLVI, Varenna, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33098 (Accessed June 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2001, Updated January 27, 2020