Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

Local Electrode Atom Probes: Prospects for 3D Atomic-Scale Metrology Applications in the Semiconductor and Data Storage Industries

February 1, 2001

Author(s)

T F. Kelly, T T. Gribb, R L. Martens, D J. Larson, N Tabat, R J. Matyi, Thomas J. Shaffner

Optical and Electrical Thickness Measurements of Alternate Gate Dielectrics: a Fundamental Difference

February 1, 2001

Author(s)

Curt A. Richter, Nhan Van Nguyen, Evgeni Gusev, T H. Zabel, G A. Alers

We will describe a fundamental difference between the interpretation of optical and electrical measurements of gate dielectric thickness. This difference has

Measuring Antennas Above 1 GHz

February 1, 2001

Author(s)

Michael Windler, Dennis G. Camell

The techniques for EMC measurements used with antennas above 1 GHz have been gleaned from methods used at lower frequencies. The assumptions made in applying

⁸⁵Rb BEC Near a Feshbach Resonance

February 1, 2001

Author(s)

N R. Claussen, S L. Cornish, J L. Roberts, Eric A. Cornell, C E. Wieman

Bose-Einstein condensation has been achieved in a magnetically trapped sample of 85Rb atoms. Stable condensates of up to 10 4 atoms have been created by using a

XML Representation of EXPRESS Models and Data

February 1, 2001

Author(s)

Joshua Lubell, Edward J. Barkmeyer Jr.

EXPRESS is a modeling language for use in engineering data exchange standards that combines the entity-attribute-relationship and object modeling paradigms

Fast C2D: Software for Extracting 2D Carrier Profiles from Scanning Capacitance Microscopy Images

February 1, 2001

Author(s)

Brian G. Rennex, Joseph Kopanski, Jay F. Marchiando

Gate Oxide Formation under Mild Conditions for Scanning Capacitance Microscopy

February 1, 2001

Author(s)

Duncan McBride, Joseph Kopanski

Scanning Capacitance Microscopy (SCM) can be used to measure doping density in silicon with a spatial resolution of about 10 nm. In order to make such

Light Measuring Device Diagnostics for the Photometric and Colorimetric Measurement of Flying-spot Displays

January 30, 2001

Author(s)

Paul A. Boynton, Edward F. Kelley

Flying-spot displays use narrow-spectrum high-power sources that scan the image across the display screen. They can provide a bright display with a large color

A Standard Illumination Source for the Evaluation of Display Measurement Methods and Instruments

January 30, 2001

Author(s)

John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno, Farshid Manoocheri

A prototype display measurement assessment transfer standard (DMATS) is being developed by the National Institute of Standards and Technology (NIST) to assist

Characterization of BPSG films using Neutron Depth Profiling and Neutron/X-ray Reflectometry

January 29, 2001

Author(s)

Huaiyu H. Chen-Mayer, George P. Lamaze, Sushil K. Satija

Energy Dispersive X-ray Analysis using a Microcalorimeter Detector

January 29, 2001

Author(s)

W. Harris, L. Le Tarte, H. Bakhru, W. Gibson, D. Wu, Robert E. Geer, David A. Wollman

Energy dispersive X-ray analysis (EDX) is widely used within the semiconductor community for chemical analysis and identification of features observed in

Development of a Fire Hazard Assessment Method to Evaluate the Fire Safety of Passenger Trains

January 22, 2001

Author(s)

Richard D. Peacock, Richard W. Bukowski, Paul A. Reneke, Jason D. Averill, S. H. Markos

U.S. passenger train fire safety has historically been addressed primarily through the citation of small-scale flammability and smoke emission tests and

Recent Advances in Flame Retardant Polymer Nanocomposites

January 22, 2001

Author(s)

Jeffrey W. Gilman, Takashi Kashiwagi, A B. Morgan, Richard H. Harris Jr., L D. Brassell, W H. Awad, Rick D. Davis, L Chyall, T E. Sutto, Paul C. Trulove, H DeLong

A new approach to address the ever increasing demand for higher performance flame retarded products has recently focused on use of mica-type clays nano

Improved Range Resistors for AC-DC Transfer Measurements

January 18, 2001

Author(s)

H. O. Wolcott, Joseph R. Kinard Jr., Thomas E. Lipe Jr.

This paper discusses the factors contributing to the ac-dc differences of high-voltage thermal converters. A novel resistor designed to minimize these

CASSCF Investigation of Electronic Excited States of 2-Aminopurine

January 11, 2001

Author(s)

E L. Rachofsky, J B. Ross, Morris Krauss, R Osman

2-aminopurine is a highly fluorescent analog of adenine that can be incorporated synthetically into DNA with little perturbation of the native double-helical

Long-Term Charge Offset Noise in Coulomb-Blockade Devices

January 9, 2001

Author(s)

William Huber, S Martin, Neil M. Zimmerman

While Coulomb-Blockade devices have shown promise as qubit systems or qubit state detectors, large scale parallelization of these devices is severely hampered

Toxic Yield

January 7, 2001

Author(s)

William M. Pitts

It is generally recognized that the vast majority of deaths associated with accidental enclosure fires are due to smoke inhalation. Older reviews of autopsy

Standards of Current and Capacitance Based on Single-Electron Tunneling Devices

January 1, 2001

Author(s)

Mark W. Keller

Fundamental standards of current and capacitance based on the transfer of electrons one-by-one are described. The current status of several schemes for

Tools and Diagnostics for Projection Display Metrology

January 1, 2001

Author(s)

Paul A. Boynton

Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation

Characterization of Silicon-Oxynitride Dielectric Thin Films Using Grazing Incidence X-ray Photoelectron Spectroscopy

January 1, 2001

Author(s)

E Landree, Terrence J. Jach, D Brady, A. Karamcheti, J Canterbury, W Chism, A C. Diebold

To achieve the future goals for logic device dielectric film thickness and composition metrology, a set of well-characterized calibration reference material

Evaluation of Load Cells for Legal Metrology at NIST

January 1, 2001

Author(s)

Kevin L. Chesnutwood

Load cells for use in legal metrology issues are evaluated in accordance with the National Type Evaluation Program (NTEP) and the International Organization of

Comparing and Evaluating the Performance of Primary Frequency Standards: Impact of Dead Time

January 1, 2001

Author(s)

Thomas E. Parker

A Compact Femtosecond-Laser-Based Optical Clockwork

January 1, 2001

Author(s)

Scott A. Diddams, T Udem, K R. Vogel, Christopher W. Oates, E A. Curtis, R W. Windeler, A Bartels, James C. Bergquist, Leo W. Hollberg

Bayesian Approach to Combining Results From Multiple Methods

January 1, 2001

Author(s)

Hung-Kung Liu, Nien F. Zhang

Many solutions to the problem of estimating the consensus mean from the results of multiple methods or laboratories have been proposed. In a Bayesian analysis

Integrating Sphere Simulation on Spatial Nonuniformity Errors in Luminous Flux Measurement

January 1, 2001

Author(s)

Yoshihiro Ohno, R O. Daubach

An integrating sphere simulation program, previously developed for the realization of the luminous flux unit at NIST, has been utilized to analyze spatial

Quantifying Measurement Uncertainty in Analytical Chemistry A Simplified Practical Approach

January 1, 2001

Author(s)

Thomas W. Vetter

Embedded Power Quality Solutions for Computer Numerical Control Machine Tools

January 1, 2001

Author(s)

Bradley N. Damazo, M Stephens, Johannes A. Soons, M A. Donmez

Electric Power Research Institute (EPRI) research and testing, conducted over many years, has indicated that variations in electric power quality can negatively

First Comparison of Remote Cesium Fountains

January 1, 2001

Author(s)

Thomas E. Parker, P Hetzel, Steven R. Jefferts, S Weyers, L M. Nelson, Andreas Bauch, Judah Levine

The Determination of the Emissivity of the Variable-Temperature Blackbody Used in the Dissemination of the U.S. National Scale of Radiance Temperature, ed. by B. Fellmuth, J. Seidel, and G. Scholz

January 1, 2001

Author(s)

Howard W. Yoon, Charles E. Gibson, Bettye C. Johnson

Interference in the 2.4 GHz ISM Band: Impact on the Bluetooth Access control Performance

January 1, 2001

Author(s)

Nada T. Golmie, F Mouveaux

The emergence of Bluetooth devices operating in the same 2.4 GHz ISM frequency band as existing Wireless Local Area Network devices implementing the IEEE 802.11