Day, G.
(2001),
Metrology for the Optoelectronics Industry, Proc., SPIE, Harnessing Light, Optical Science and Metrology at NIST, San Diego, CA
(Accessed July 26, 2024)
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Metrology for the Optoelectronics Industry
Published
Author(s)
Proceedings Title
Proc., SPIE, Harnessing Light, Optical Science and Metrology at NIST
Volume
4450
Conference Location
San Diego, CA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 1, 2001, Updated January 27, 2020