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Metrology for the Optoelectronics Industry

Published

Author(s)

Gordon W. Day
Proceedings Title
Proc., SPIE, Harnessing Light, Optical Science and Metrology at NIST
Volume
4450
Conference Location
San Diego, CA

Citation

Day, G. (2001), Metrology for the Optoelectronics Industry, Proc., SPIE, Harnessing Light, Optical Science and Metrology at NIST, San Diego, CA (Accessed June 25, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 1, 2001, Updated January 27, 2020