Day, G.
(2001),
Metrology for the Optoelectronics Industry, Proc., SPIE, Harnessing Light, Optical Science and Metrology at NIST, San Diego, CA (Accessed May 15, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Metrology for the Optoelectronics Industry
Published
Author(s)
Proceedings Title
Proc., SPIE, Harnessing Light, Optical Science and Metrology at NIST
Volume
4450
Conference Location
San Diego, CA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created July 1, 2001, Updated January 27, 2020