Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Emission and Immunity Standards: Replacing Field-at-a-Distance Measurements with Total-Radiated-Power Measurements

Published

Author(s)

Perry F. Wilson, Galen H. Koepke, John M. Ladbury, Christopher L. Holloway

Abstract

The radiation and reception patterns of devices become more complicated as the measurement frequency is increased. These complicated patterns pose a challenge to EMC emission/immunity tests where the direction of maximum radiation/reception needs to be found. Full spherical scans using small angular steps are too burdensome for EMC measurement purposes. This paper examines the use of simpler total radiated power measurements combined with theory-based directivity estimates to generate accurate estimates of maximum radiation/reception. This approach may be a useful alternative to present emission/immunity test methods as frequencies above 1 GHz become necessary for EMC standards. Radiation pattern data for theory-based estimates, Monte Carlo simulations of an arbitrary device, and measurements on a sample device are all presented, and good agreement is demonstrated.
Proceedings Title
Proc., IEEE Intl. Electromagnetic Compatibility (EMC) Symposium
Conference Dates
August 13-17, 2001
Conference Location
Montreal, 1, CA

Keywords

Emission testing, immunity testing, international EMC standards, total radiated power

Citation

Wilson, P. , Koepke, G. , Ladbury, J. and Holloway, C. (2001), Emission and Immunity Standards: Replacing Field-at-a-Distance Measurements with Total-Radiated-Power Measurements, Proc., IEEE Intl. Electromagnetic Compatibility (EMC) Symposium, Montreal, 1, CA (Accessed May 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 31, 2001, Updated October 12, 2021