Anderson, W.
(2001),
Electrometrology and NIST -- New Directions, National Conference of Standards Laboratories Workshop and Symposium (NCSL), San Jose, CA (Accessed May 16, 2026)
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Electrometrology and NIST -- New Directions
Published
Author(s)
Abstract
I gaze into a somewhat cloudy crystal ball to predict the directions of electrical metrology in the next fifteen years. The emphasis on standards based on fundamental constants of nature and on quantum-mechanical principles will move from the base units to the derived, from the laboratory to the marketplace. The need for NIST to lead the world in implementing fundamental electrical measurements will not change. What will change are the methods through which NIST transfers its measurement accuracy to its customers, making full use of the internet (e.g., SIMnet) and offspring of the coming marriage of wireless and digital technologies.Proceedings Title
National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 1-26, 2001
Conference Location
San Jose, CA
Conference Title
National Conference of Standards Laboratories (NCSL)
Pub Type
Conferences
Keywords
digital, electrical, forecast, future, internet, measurement, metrology, NIST, prediction
Citation
Issues
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Created July 1, 2001, Updated February 17, 2017