Nanoscale Reliability Group
The performance of advanced, reliable engineering materials requires that the proper atoms are in the correct place within the material, and that they are displaying the properties we intend. Innovative metrologies are developed in the realms of electron, ion, and scanned probe microscopies, to identify and locate atomic species, and to determine physical responses of materials. Test structures, measurement methods, and in operando approaches are developed to measure performance of complex material systems and geometries with high spatial resolution, enabling new reliability physics to be applied to nanoscale structures for computing, structural material, and energy applications. We integrate our material structure metrologies with material performance and reliability assessments.
Recent Group Highlights
Researchers from the Nanoscale Reliability Group have developed a new atomic force microscopy (AFM) method to measure the development of physical properties during their formation during 3-D printing. Sample-coupled-resonance photorheology (SCRPR) spatially resolves the evolution of properties over time scales of approximately 10 millisecond. For details, see New NIST Method Measures 3D Polymer Processing Precisely.