Nanoscale Reliability Group
Innovative metrologies are developed in the realms of electron, ion, and scanned probe microscopies, to identify and locate atomic species, and to determine physical responses of materials. Test structures, measurement methods, and in operando approaches are developed to measure performance of complex material systems and geometries with high spatial resolution, enabling new reliability physics to be applied to nanoscale structures for computing, structural material, and energy applications. We integrate our material structure metrologies with material performance and reliability assessments.
Group Highlight: Transmission SEM in Microscopy Today Feature Article
Researchers from the Nanoscale Reliability Group have been honored with preparing the invited feature article and cover image of the March 2017 issue of Microscopy Today, which is the microscopy field’s highest-circulation trade magazine. This particular issue carries the added significance of celebrating the 75th anniversary of the Microscopy Society of America and the 50th anniversary of the Microanalysis Society.
See Microscopy Today: Jason Holm and Robert R. Keller, “Acceptance Angle Control for Improved Transmission imaging in an SEM,” volume 25, pp. 12-19 (2017). http://www.microscopy-today.com/ (available online 6 March, 2017).