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Ryan White (Fed)

Materials Research Engineer

Research interests

  • Electron and ion microscopy
  • Applying artificial intelligence and machine learning principals to enable quantitative materials characterization
  • Multi-scale, correlative characterization of processing/structure/property relationships
  • Novel detector design for scanning and transmission electron microscopes


Publications: 30 Citations: 468 h-index: 11 i10-index: 13
(Updated 2/24/2017) - Google Scholar Profile


National Institute of Standards and Technology
2018 - MML Accolade, Service and Support to MML

2013 - 2015 - NIST/NRC Postdoctoral Research Fellowship 

The Pennsylvania State University
2007 - 2010 - 3M Graduate Research Fellowship

2010 - Materials Visualization Competition, Best in Show, Cover of J. American Ceramic Society

2009 - Materials Visualization Competition, Second Place, Scientific Category

2009 - Graduate Research Excellence Award


Orientation Mapping of Graphene Using 4D STEM-in-SEM

Benjamin W. Caplins, Jason D. Holm, Ryan M. White, Robert R. Keller
A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning
Created May 21, 2019, Updated December 8, 2022