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Search Publications by: Ryan White (Fed)

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Displaying 1 - 16 of 16

Orientation Mapping of Graphene Using 4D STEM-in-SEM

October 13, 2020
Author(s)
Benjamin W. Caplins, Jason D. Holm, Ryan M. White, Robert R. Keller
A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning transmission electron microscopy in the scanning electron microscope), collects a diffraction

Hot isostatic pressing (HIP) to achieve isotropic microstructure and retain as-built strength in additive manufacturing titanium alloy (Ti-6Al-4V)

September 23, 2019
Author(s)
Jake T. Benzing, Nikolas W. Hrabe, Timothy P. Quinn, Ryan M. White, Ross A. Rentz, Magnus Ahlfors
Hot isostatic pressing (HIP) treatments are used to seal internal porosity because defects exist in as-built Ti-6Al-4V parts produced by electron beam melting powder bed fusion. Standard HIP treatment of Ti-6Al-4V parts reduces internal porosity but

Layer-by-Layer Thinning of MoS2 via Laser Irradiation

April 17, 2019
Author(s)
Bien Cuong Tran Khac, Ryan White, Frank W. DelRio, Koo-hyun Chung
Layer-by-layer thinning of molybdenum disulfide (MoS2) via laser irradiation was examined using Raman spectroscopy and atomic force microscopy. In particular, the effects of number of layers, laser conditions, and substrate were systematically identified

Laser-assisted atom probe tomography of Ti/TiN films deposited on Si

December 21, 2016
Author(s)
Norman A. Sanford, Paul T. Blanchard, Ryan M. White, Michael R. Vissers, Albert Davydov, D R. Diercks, David P. Pappas
Laser-assisted atom probe tomography (L-APT) was used to examine superconducting TiN/Ti/TiN trilayer films with nominal respective thicknesses of 5/5/5 (nm). The trilayers were deposited on Si substrates by reactive sputtering. Electron energy loss

Introducing a New NIST Reference Material: Multiwall Carbon Nanotube Soot

July 25, 2016
Author(s)
Ann C. Chiaramonti Debay, Ryan M. White, Jason D. Holm, Elisabeth Mansfield
Multi-walled carbon nanotubes (MWCNTs) play a significant role in the nascent nanotechnology industry, due to their remarkable combination of mechanical, thermal, and electrical properties. These materials are specialty additives, reinforcing a diverse

Near-theoretical fracture strengths in native and oxidized silicon nanowires

June 21, 2016
Author(s)
Frank W. DelRio, Ryan M. White, Sergiy Krylyuk, Albert Davydov, Lawrence H. Friedman, Robert F. Cook
In this letter, fracture strengths σf of native and oxidized silicon nanowires (SiNWs) were determined via atomic force microscopy bending experiments and nonlinear finite element analysis. In the native SiNWs, σf in the Si was comparable to the