Holm, J.
and White, R.
(2017),
Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging, Microscopy and Microanalysis, 2017, St Louis, MO, US, [online], https://doi.org/10.1017/S1431927617003476, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922799
(Accessed December 13, 2024)
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Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging
Published
Author(s)
Jason Holm,
Abstract
This is a published conference abstract for Microscopy and Microanalysis, 2017.Proceedings Title
Microscopy and Microanalysis, 2017
Volume
23 (Suppl 1)
Conference Dates
August 6-10, 2017
Conference Location
St Louis, MO, US
Pub Type
Conferences
Download Paper
Keywords
STEM-in-SEM, transmission-SEM, analytical SEM, HAADF
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 3, 2017, Updated April 19, 2022