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Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging



Jason Holm, Ryan White


This is a published conference abstract for Microscopy and Microanalysis, 2017.
Proceedings Title
Microscopy and Microanalysis, 2017
23 (Suppl 1)
Conference Dates
August 6-10, 2017
Conference Location
St Louis, MO, US


STEM-in-SEM, transmission-SEM, analytical SEM, HAADF


Holm, J. and White, R. (2017), Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging, Microscopy and Microanalysis, 2017, St Louis, MO, US, [online],, (Accessed July 25, 2024)


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Created August 3, 2017, Updated April 19, 2022