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Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging

Published

Author(s)

Jason Holm, Ryan White

Abstract

This is a published conference abstract for Microscopy and Microanalysis, 2017.
Proceedings Title
Microscopy and Microanalysis, 2017
Volume
23 (Suppl 1)
Conference Dates
August 6-10, 2017
Conference Location
St Louis, MO, US

Keywords

STEM-in-SEM, transmission-SEM, analytical SEM, HAADF

Citation

Holm, J. and White, R. (2017), Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging, Microscopy and Microanalysis, 2017, St Louis, MO, US, [online], https://doi.org/10.1017/S1431927617003476, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922799 (Accessed July 25, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 3, 2017, Updated April 19, 2022