@conference{876836,
  author = {Jason Holm and Ryan White},
  title = {Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging},
  year = {2017},
  number = {23 (Suppl 1)},
  month = {2017-08-03 04:08:00},
  publisher = {Microscopy and Microanalysis, 2017, St Louis, MO, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922799},
  doi = {https://doi.org/10.1017/S1431927617003476},
  language = {en},
}