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A Workflow for Imaging 2D Materials using 4D STEM-in-SEM

Published

Author(s)

Benjamin W. Caplins, Ryan M. White, Jason D. Holm, Robert R. Keller
Proceedings Title
Proceedings of Microscopy and Microanalysis 2019
Conference Dates
August 4-8, 2019
Conference Location
Portland, OR
Conference Title
Microscopy and Microanalysis 2019

Citation

Caplins, B. , White, R. , Holm, J. and Keller, R. (2019), A Workflow for Imaging 2D Materials using 4D STEM-in-SEM, Proceedings of Microscopy and Microanalysis 2019, Portland, OR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927530 (Accessed April 11, 2021)
Created August 4, 2019, Updated February 22, 2019