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On Mass-Thickness Contrast in STEM-in-SEM Images



Jason D. Holm, Ryan M. White


This is an extended abstract for Microscopy and Microanalysis, August 2017
Proceedings Title
Microscopy and Microanalysis, 2017
23 (Suppl 1)
Conference Dates
August 6-10, 2017
Conference Location
St. Louis, MO


STEM-in-SEM, t-SEM, mass thickness contrast, acceptance angle


Holm, J. and White, R. (2017), On Mass-Thickness Contrast in STEM-in-SEM Images, Microscopy and Microanalysis, 2017, St. Louis, MO, [online], (Accessed May 10, 2021)
Created August 4, 2017, Updated August 28, 2019