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On Mass-Thickness Contrast in STEM-in-SEM Images



Jason Holm, Ryan White


This is an extended abstract for Microscopy and Microanalysis, August 2017
Proceedings Title
Microscopy and Microanalysis, 2017
23 (Suppl 1)
Conference Dates
August 6-10, 2017
Conference Location
St. Louis, MO, US


STEM-in-SEM, t-SEM, mass thickness contrast, acceptance angle


Holm, J. and White, R. (2017), On Mass-Thickness Contrast in STEM-in-SEM Images, Microscopy and Microanalysis, 2017, St. Louis, MO, US, [online],, (Accessed May 22, 2024)


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Created August 3, 2017, Updated April 19, 2022