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On Mass-Thickness Contrast in STEM-in-SEM Images

Published

Author(s)

Jason D. Holm, Ryan M. White

Abstract

This is an extended abstract for Microscopy and Microanalysis, August 2017
Proceedings Title
Microscopy and Microanalysis, 2017
Volume
23 (Suppl 1)
Conference Dates
August 6-10, 2017
Conference Location
St. Louis, MO

Keywords

STEM-in-SEM, t-SEM, mass thickness contrast, acceptance angle

Citation

Holm, J. and White, R. (2017), On Mass-Thickness Contrast in STEM-in-SEM Images, Microscopy and Microanalysis, 2017, St. Louis, MO, [online], https://doi.org/10.1017/S1431927617003683 (Accessed May 10, 2021)
Created August 4, 2017, Updated August 28, 2019