NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

On Mass-Thickness Contrast in STEM-in-SEM Images

Published

Author(s)

Jason Holm, Ryan White

Abstract

This is an extended abstract for Microscopy and Microanalysis, August 2017
Proceedings Title
Microscopy and Microanalysis, 2017
Volume
23 (Suppl 1)
Conference Dates
August 6-10, 2017
Conference Location
St. Louis, MO, US
Pub Type
Conferences

Download Paper

https://doi.org/10.1017/S1431927617003683
Local Download

Keywords

STEM-in-SEM, t-SEM, mass thickness contrast, acceptance angle
Materials

Citation

Holm, J. and White, R. (2017), On Mass-Thickness Contrast in STEM-in-SEM Images, Microscopy and Microanalysis, 2017, St. Louis, MO, US, [online], https://doi.org/10.1017/S1431927617003683, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922829 (Accessed October 8, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created August 3, 2017, Updated April 19, 2022
Was this page helpful?