Holm, J.
and White, R.
(2017),
On Mass-Thickness Contrast in STEM-in-SEM Images, Microscopy and Microanalysis, 2017, St. Louis, MO, US, [online], https://doi.org/10.1017/S1431927617003683, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922829
(Accessed October 14, 2024)
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On Mass-Thickness Contrast in STEM-in-SEM Images
Published
Author(s)
Jason Holm,
Abstract
This is an extended abstract for Microscopy and Microanalysis, August 2017Proceedings Title
Microscopy and Microanalysis, 2017
Volume
23 (Suppl 1)
Conference Dates
August 6-10, 2017
Conference Location
St. Louis, MO, US
Pub Type
Conferences
Download Paper
Keywords
STEM-in-SEM, t-SEM, mass thickness contrast, acceptance angle
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 3, 2017, Updated April 19, 2022