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PUBLICATIONS

On Mass-Thickness Contrast in STEM-in-SEM Images

Published

Author(s)

Jason Holm, Ryan White

Abstract

This is an extended abstract for Microscopy and Microanalysis, August 2017
Proceedings Title
Microscopy and Microanalysis, 2017
Volume
23 (Suppl 1)
Conference Dates
August 6-10, 2017
Conference Location
St. Louis, MO, US
Pub Type
Conferences

Download Paper

https://doi.org/10.1017/S1431927617003683
Local Download

Keywords

STEM-in-SEM, t-SEM, mass thickness contrast, acceptance angle
Materials

Citation

Holm, J. and White, R. (2017), On Mass-Thickness Contrast in STEM-in-SEM Images, Microscopy and Microanalysis, 2017, St. Louis, MO, US, [online], https://doi.org/10.1017/S1431927617003683, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922829 (Accessed October 17, 2025)

Issues

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Created August 3, 2017, Updated April 19, 2022
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