@conference{876826,
  author = {Jason Holm and Ryan White},
  title = {On Mass-Thickness Contrast in STEM-in-SEM Images},
  year = {2017},
  number = {23 (Suppl 1)},
  month = {2017-08-03 04:08:00},
  publisher = {Microscopy and Microanalysis, 2017, St. Louis, MO, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922829},
  doi = {https://doi.org/10.1017/S1431927617003683},
  language = {en},
}