TY  - CONF
AU  - Jason Holm
AU  - Ryan White
C2  - Microscopy and Microanalysis, 2017, St. Louis, MO, US
DA  - 2017-08-03 04:08:00
DO  - https://doi.org/10.1017/S1431927617003683
LA  - en
M1  - 23 (Suppl 1)
PB  - Microscopy and Microanalysis, 2017, St. Louis, MO, US
PY  - 2017
TI  - On Mass-Thickness Contrast in STEM-in-SEM Images
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922829
ER  -