Jason Holm

Publications

A Workflow for Imaging 2D Materials using 4D STEM-in-SEM

August 04, 2019

Author(s):

Benjamin W. Caplins, Ryan M. White, Jason D. Holm, Robert R. Keller

Grain Orientation Mapping of Graphene in a Scanning Electron Microscope

May 01, 2019

Author(s):

Benjamin W. Caplins, Jason D. Holm, Robert R. Keller

A scanning transmission electron diffraction method is developed for use in the scanning electron microscope to perform orientational imaging microscopy of 2D...

A programmable dark-field detector for imaging two-dimensional materials in the scanning electron microscope

February 07, 2019

Author(s):

Benjamin W. Caplins, Jason D. Holm, Robert R. Keller

Unit cell orientation information is encoded in electron diffraction patterns of crystalline materials. Traditional transmission electron detectors implemented...

Transmission Imaging with a Programmable Detector in a Scanning Electron Microscope

September 13, 2018

Author(s):

Benjamin W. Caplins, Jason D. Holm, Robert R. Keller

A new type of angularly selective electron detector for use in a scanning electron microscope is presented. The detector leverages a digital micromirror device...

Developing a Programmable STEM Detector for the Scanning Electron Microscope

August 01, 2018

Author(s):

Benjamin W. Caplins, Robert R. Keller, Jason D. Holm

This is an extended abstract for the 2018 Microscopy and Microanalysis meeting.