Jason Holm

Publications

X-Ray Computed Tomography using Partially Coherent Fresnel Diffraction with Application to an Optical Fiber

January 18, 2021

Author(s)

Zachary H. Levine, Edward Garboczi, Adele Peskin, Axel A. Ekman, Elisabeth Mansfield, Jason Holm

An algorithm for partially coherent x-ray computed tomography including Fresnel diffraction is developed and applied to an optical fiber. The computing time is

Orientation Mapping of Graphene Using 4D STEM-in-SEM

October 13, 2020

Author(s)

Benjamin W. Caplins, Jason D. Holm, Ryan M. White, Robert R. Keller

A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning

Introduction to STEM-in-SEM Part 1: Imaging and Diffraction with Common Commercially Available Transmission Detectors

March 12, 2020

Author(s)

Jason D. Holm, Benjamin W. Caplins

Introduction to STEM-in-SEM Part 2: Imaging and Diffraction with a Programmable Pixelated Detector

March 12, 2020

Author(s)

Jason D. Holm, Benjamin W. Caplins

Obtaining Diffraction Patterns from Annular Dark-Field STEM-in-SEM Images: Towards a Better Understanding of Image Contrast

February 24, 2020

Author(s)

Jason D. Holm, Benjamin W. Caplins, Jason P. Killgore

This contribution demonstrates experimentally how a series of annular dark-field transmission images collected in a scanning electron microscope (SEM) with a

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