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A single-atom-thick sheet of carbon known as graphene has remarkable properties on its own, but things can get even more interesting when you stack up multiple
Using tiny laser-launched projectiles and troves of data, scientists can more quickly bridge the gap between a material’s microscopic properties and its real
NIST’s Material Measurement Laboratory and Physical Measurement Laboratory are developing a first-of-kind X-ray testbed for operando monitoring of catalytic
Computational materials design requires a variety of tools to model processing-structure-property relationships across a range of time and length scales. This
Overview Capture of carbon dioxide from the air (direct air capture; DAC) combined with energy efficiency and carbon capture, utilization and storage (CCUS)
The mission of the Micro and Nanoplastic (MNP) Metrology Project is to assist regulators in assessing the human health and environmental risks associated with
Ann Chiaramonti Debay, Daniel Schreiber, Karen Kruska, Kayla Yano
Atom probe tomography (APT) is a powerful analytical technique whose strengths lie in its combination of three-dimensional reconstructions, (sub)nanometer
This paper lays out a general approach for evaluating and optimizing a Raman spectroscopy setup to ensure the collection of reliable spectral data and/or Raman
Additively manufactured Inconel 625 is particularly susceptible to the formation of niobium-rich δ-phase precipitates in the interdendritic regions during high
GSAS_USE addresses the effects of systematic errors in Rietveld refinements. The errors are categorized into multiplicative, additive, and peak-shape types
This software package implements functions to simulate spherical, ellipsoid and cubic polyatomic nanoparticles with arbitrary crystal structures and to
We implemented a Bayesian-statistics approach for subtraction of incoherent scattering from neutron total-scattering data. In this approach, the estimated
LEAP 4000X Si/HR Imaging time-of-flight mass spectrometer and field ion microscope. Can deliver 3-D, isotopically- and chemically- resolved images Sub-nanometer
This in-situ indentation system can be integrated into electron microscopes as well as being run in other unusual setups. With a load capacity of 150 mN, this
A TESCAN MIRA3 Schottky field-emission scanning electron microscope with 4 30 mm 2 silicon x-ray drift detectors which has been automated for particle and
The TA Instruments RPA elite rubber process analyzer (RPA) is a strain-controlled rotational shear rheometer for the characterization of polymers, composites