Tools and Instruments

Displaying 1 - 17 of 17

Analytical Electron Microscope

The Titan 80-300 is a transmission electron microscope (TEM) equipped with spectroscopic detectors to allow chemical, elemental, and other analytical

Atom Probe Tomography (LEAP 4000X Si/HR – Local Electrode Atom Probe)

LEAP 4000X Si/HR Imaging time-of-flight mass spectrometer and field ion microscope. Can deliver 3-D, isotopically- and chemically- resolved images Sub-nanometer

Differential Scanning Calorimeter

Differential Scanning Calorimetry, or DSC, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is

Focused Ion Beam

The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase measurements

Fourier Transform Infrared Spectroscopy

Fourier Transform Infrared (FTIR) Spectroscopy is a spectroscopic technique in which the vibrational modes of the molecules comprising a material of interest

Hysitron PI-85 Picoindentor

This in-situ indentation system can be integrated into electron microscopes as well as being run in other unusual setups. With a load capacity of 150 mN, this

Material Analysis Using Neutron Depth Profiling

Light elements such as helium, lithium, boron, and nitrogen are essential constituents in materials that enable energy technologies; lithium ion batteries

NIST PTIR Instrumentation and Capabilities

Photothermal induced resonance (PTIR) combines the spatial resolution of atomic force microscopy (AFM) with the specificity of absorption spectroscopy

A picture of the NIST resonant soft xray instrument and visiting NIST scientists

Polarized Resonant Soft X-ray Scattering (P-RSoXS)

Built with a collaboration with the RSoXS project in the NIST Materials Science and Engineering Division, polarized resonant soft X-ray scattering (P-RSoXS) is

Positron Annihilation Lifetime Spectrometer

Positron annihilation lifetime spectroscopy uses positrons to probe material defects/voids/free volume at the sub-nm scale. The general working principle is

Rubber Process Analyzer

The TA Instruments RPA elite rubber process analyzer (RPA) is a strain-controlled rotational shear rheometer for the characterization of polymers, composites

$View of the sample area in the X-ray Diffraction (XRD) end station on the Beamline for Material Measurement (BMM).$

Synchrotron X-ray Diffraction (XRD)

The X-ray diffraction (XRD) end station measures constructive interference of the x-ray wave with repeating atomic and interfacial structure in materials. At

TESCAN MIRA3 for automated electron microscopy

A TESCAN MIRA3 Schottky field-emission scanning electron microscope with 4 30 mm 2 silicon x-ray drift detectors which has been automated for particle and

Thermogravimetric Analyzer

Thermogravimetric Analysis, or TGA, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is used for

Vector Potential Photoelectron Microscope (VPPEM)

The Vector Potential Photoemission Microscope endstation sits at the end of both the SST-I and SST-II beamlines, providing both soft (0.1 keV to 2.2 keV) and

Picture of the sample area of the NIST X-ray Adsorbtion Fine Structure instrument, with NIST scientist Bruce Ravel, located at the National Synchrotron Light Source.

X-ray Absorption Fine Structure (XAFS)

The XAFS station uses a tunable, monochromatic, and moderately high energy X-ray beam (4.5 keV to 23.5 keV) for X-ray absorption spectroscopy measurements. The

X-ray Photoelectron Spectroscopy

The Material Measurement Science Division at NIST performs surface chemical analysis using X-ray Photoelectron Spectroscopy (XPS) with capabilities for routine