The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase measurements to be performed at high spatial resolution. The NNL600 operates between 1 keV and 30 keV electron beam energy and 2 kV and 30 kV ion beam accelerating voltage. The NNL600 has a thermal (Schottky) field emission electron source and a Sidewinder ion column using a Ga+ liquid metal ion source. It can be used for TEM sample preparation; 3D Slice and View imaging, elemental, and phase analysis; nano-fabrication using electron and ion beam deposition; and conventional electron and ion beam imaging. The NNL600 is also equipped with removable STEM detector, cryo stage, nano manipulator, and multiple gas injection systems.