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Static force, such as the weight of a person standing motionless on a bathroom scale or the force that an office full of equipment exerts on a high-rise floor
Using tiny laser-launched projectiles and troves of data, scientists can more quickly bridge the gap between a material’s microscopic properties and its real
NIST’s Material Measurement Laboratory and Physical Measurement Laboratory are developing a first-of-kind X-ray testbed for operando monitoring of catalytic
NIST’s Material Measurement Laboratory and Communications Technology Laboratory are developing a new spectroscopy for intermolecular interactions. The team is
The mission of the Micro and Nanoplastic (MNP) Metrology Project is to assist regulators in assessing the human health and environmental risks associated with
Neuromorphic computing is a radical new approach to information processing for artificial intelligence where, instead of using digital electronics, inspiration
Debashish Sur, Jason Hattrick-Simpers, Howie Joress, John Scully
Compositionally complex alloys containing four or more principal elements provide an opportunity to explore a wide range of compositions, processing, and
Bruce D. Ravel, Trevor Tyson, Han Zhang, Sizhan Liu, SANJIT GHOSE, U.J. Idehenre, Yury Barnakov, S.A. Basun, D.R. Evans
Nanoscale BaTiO3 particles (10 nm) prepared by ball-milling a mixture of oleic acid and heptane have been reported to have an electric polarization several
Jeffrey Schwartz, Sergiy Krylyuk, Devon Jakob, Albert Davydov, Andrea Centrone
Control over the local chemical composition and spatial heterogeneities in nanomaterials provides a means to impart new functions and to tailor their properties
Ran Tao, Sukrut Prashant Phansalkar, Aaron M. Forster, Bongtae Han
Cure kinetics of epoxy molding compounds (EMCs) is a fundamental material property that affects the molding process of semiconductor chips and final package
CLIP is an analysis program for fluorescence lifetime images. It provides the user with the ability to fit or calculate the phasor plots for lifetime decays
LEAP 4000X Si/HR Imaging time-of-flight mass spectrometer and field ion microscope. Can deliver 3-D, isotopically- and chemically- resolved images Sub-nanometer
This in-situ indentation system can be integrated into electron microscopes as well as being run in other unusual setups. With a load capacity of 150 mN, this
A TESCAN MIRA3 Schottky field-emission scanning electron microscope with 4 30 mm 2 silicon x-ray drift detectors which has been automated for particle and
The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to