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Additive manufacturing (AM) of ceramic components suffers from inconsistent quality and high defect rates due to a lack of standardized feedstock characterization and handling protocols, inadequate in-process monitoring capabilities, and insufficient post-production non-destructive evaluation methods. While metrology approaches are in development to detect critical flaws like microcracking, porosity, and dimensional deviations in complex ceramic geometries, the transfer of these solutions to industrial stakeholders remains limited, constraining widespread adoption and preventing ceramics AM from reaching its full potential in high-performance applications such as aerospace, medical devices, and energy systems. This workshop will convene leading experts in ceramics manufacturing, metrology instrumentation, and AM process control to develop a comprehensive 3-year roadmap identifying critical measurement gaps, prioritizing technology development needs, and establishing validation protocols.
Agenda
DAY 1 — Wednesday, June 10: Landscape Assessment | ||
| 8:15-8:30 | Welcome Remarks | Kate Beers, Director, Material Measurement Laboratory, NIST |
| 8:30-8:50 | Welcome & Workshop Overview | Russell Maier, Andrew Allen, Igor Levin, NIST |
| 8:50-9:20 | Ceramic AM at Sandia: From Material Development to Mission Impact | Dale Cillessen, Sandia |
| 9:20-9:50 | Polymer-Derived Ceramics for Microelectronics | Mark O'Masta, HRL |
| 9:50-10:10 | Break | |
| Post-Build NDT Session | ||
| 10:10-10:30 | Multiscale X-ray CT for Defect Quantification | Herminso Villarraga-Gómez, Zeiss |
| 10:30-10:50 | Developing the Neutron and X-ray Tomography (NeXT) System | Jacob LaManna, NIST NCNR |
| 10:50-11:10 | Additive Process Signature Assessments | Brigid Mullaney, UNC Charlotte |
| 11:10-11:30 | 3D Characterization of Defects and Microstructure in Additively Manufactured Alloys | David Rowenhorst, NRL |
| 11:30-11:50 | Break | |
| 11:50-12:10 | Ultrasound-Based Insight into Defects and Mechanical Integrity in Cold Sintered Ceramics | Andrea Arguelles, Penn State |
| 12:10-12:30 | The Future of Porosimetry is Mercury-Free: eGaIn for Pore Characterization in Ceramic AM | Alyssa Henderson, Anton Paar |
| 12:30-1:30 | Lunch | |
| Feedstock Characterization Session | ||
| 1:30-1:50 | Strategies for Ceramic Slurry Development in VPP | MaryKate Davies, CoorsTek |
| 1:50-2:10 | DLP Printing for Industrial Ceramic AM | Taylor Shoulders, Tethon 3D |
| 2:10-2:30 | Quality-by-Design Principles in DIW AM | Blair Brettmann, Georgia Tech |
| 2:30-2:40 | Break | |
| 2:40-3:00 | Preceramic Polymer-Based AM Inks | Subramanian Ramakrishnan, FSU |
| 3:00-3:20 | Quality Control & Standardization in VPP | Adriana Joyce, AdvaCera |
| 3:20-3:40 | Break | |
| 3:40-4:20 | Panel: Feedstock Qualification | MaryKate Davies, CoorsTek, Taylor Shoulders, Tethon, Jeff d'Eon, FormLabs, Nick Ku, ARL, Adriana Joyce, AdvaCera, Mark O'Masta, HRL, Lynnora Grant, UNCC |
| 4:20-5:20 | Breakout Session: 45 min followed by 15 min plenary with the leads reporting their summary notes | All participants — Three Parallel Sessions |
DAY 2 — Thursday, June 11: Metrology Deep Dive | ||
| 8:30-9:00 | Regulated AM Medical Devices | Matthew Di Prima, FDA CDRH |
| 9:00-9:20 | Advanced Materials & Manufacturing Technologies Office Portfolio and Interests in Ceramics | Willie Kemp, DOE AMMTO |
| Standards & Regulatory Session | ||
| 9:20-9:40 | Strength Testing & Defect Analysis | Maximilian Staudacher, Leoben |
| 9:40-10:00 | Standardization Efforts in Ceramic AM | Brandon Cox, Honeywell KCNSC |
| 10:00-10:20 | Standardization for Ceramic AM | Benjamin Dutton, MTC UK |
| 10:20-10:40 | Break | |
| 10:40-11:00 | Working Curve ILS | Callie Higgins, NIST |
| 11:00-11:20 | TBD | Chika Matsunaga, AIST |
| 11:20-11:30 | Break | |
| Considerations for Non-Oxides | ||
| 11:30-11:50 | Multimaterial DIW for Functionally Graded Ceramics | Nicholas Ku, DEVCOM ARL |
| 11:50-12:10 | Strategies for 3D Printing SiC | Corson Cramer, ORNL |
| 12:10-12:30 | Additive Manufacturing of Ceramics | Amit Bandyopadhyay, WSU |
| 12:30-1:30 | Lunch | |
| In-Situ Process Monitoring | ||
| 1:30-1:50 | Maturing Ceramic AM: VPP Process-Structure-Property | Kwan-Soo Lee, LANL |
| 1:50-2:10 | Material Extrusion: In-Situ Monitoring | Alex Gourley, AFRL |
| 2:10-2:30 | CERIA AI for Metrology & QA | Eric Louradour, 3D Ceram |
| Post-Processing | ||
| 2:30-2:50 | Ceramic VPP: Slurry, Post-Processing, Aerospace | Sadaf Sobhani, Cornell |
| 2:50-3:10 | Ultrafast Debinding for 3D Printed Ceramics | Majid Minary, UT Dallas |
| 3:10-3:30 | AM Bench: Measurement Science for AM | Lyle Levine, NIST |
| 3:30-3:50 | Break | |
| 3:50-4:30 | Panel: Post-Build Evaluation/Qualification | Kathleen Maleski, GE Aerospace, Jesse Adamczyk, Sandia, Maximilian Staudacher, Leoben, Herminso Villarraga-Gómez, Zeiss, Brandon Cox Honeywell, Eric Louradour, 3D Ceram |
| 4:30-5:30 | Breakout Session: 45 min followed by 15 min plenary with the leads reporting their summary notes | All participants — Three Parallel Sessions |
DAY 3 — Friday, June 12: Applications & Roadmapping (Half Day) | ||
| 8:30-9:00 | Challenge A Summary: Defect Criticality, Formation & Metrology 15 min summary followed by 15 min audience Q&A | Keith Bowman, Constellation Professor of Engineering, UMBC |
| 9:00-9:30 | Challenge B Summary: Qualification & Certification 15 min summary followed by 15 min audience Q&A | Anteneh Kebbede, Technical Fellow, GE Aerospace Research |
| 9:30-10:00 | Challenge C Summary: Process Monitoring, Data & Reproducibility 15 min summary followed by 15 min audience Q&A | Lionel Vargas-Gonzalez, Supervisory Materials Engineer, DEVCOM Army Research Laboratory |
| 10:00-10:10 | Break | |
| Ceramic AM: High Impact Applications | ||
| 10:10-10:30 | DIW of Textured Piezoelectric Ceramics | Chris Eadie, Penn State ARL |
| 10:30-10:50 | 3D Printing of Ceramics for Bone Regeneration: Opportunities and Challenges | Susmita Bose, WSU |
| 10:50-11:10 | Neutron Metrology at NIST (nMAT) | Jon Seppala, NIST |
| 11:10-11:20 | Break | |
| 11:20-12:00 | Closing Remarks & Next Steps | Maier, Allen, Levin, NIST |
Lodging Information
Lodging:
End Date: Friday, June 12, 2026
Book your room Here
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