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Composition & structure

News and Updates

Projects and Programs

Autonomous Materials Science

We use autonomous experimentation (the merger of automated synthesis, characterization, AI-driven decision-making) to elucidate the role of composition

Publications

Orientation Mapping of Graphene Using 4D STEM-in-SEM

Author(s)
Benjamin W. Caplins, Jason D. Holm, Ryan M. White, Robert R. Keller
A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning

Local negative permittivity and topological-phase transition in polar skyrmions

Author(s)
Sujit Das, Zijian Hong, Vladimir Stoica, Mauro A. Goncalves, Yu-Tsun Shao, Eric Parsonnet, Eric J. Marksz, Sahar Saremi, Margaret McCarter, A Reynoso, Christian J. Long, Aaron M. Hagerstrom, D Meyers, V Ravi, B Prasad, H Zhou, Z Zhang, H Wen, F Gomez-Ortiz, P Garcia-Fernandez, J Bokor, J Iniguez, J Freeland, Nathan D. Orloff, J Junquera, Long-Qing Chen, Sayeef Salahuddin, David A. Muller, L Martin, R. Ramesh
Topological solitons such as magnetic skyrmions have drawn enormous attention as stable quasi- particle-like objects. The recent discovery of polar vortices and

Additive Manufacturing of Steels and Stainless Steels

Author(s)
Carelyn E. Campbell, Mark R. Stoudt, Fan Zhang
This work briefly reviews the classification of the different types of steels, the most common AM processes used for steel and the available powder feedstock

Software

NIST DTSA-II

NIST DTSA-II builds on the best available algorithms in the literature to simulate, quantify and plan energy dispersive x-ray analysis measurements.

NANOP

This software package implements functions to simulate spherical, ellipsoid and cubic polyatomic nanoparticles with arbitrary crystal structures and to

Tools and Instruments

Focused Ion Beam (Helios 660)

The Helios 660 NanoLab(HNL660) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase

Awards