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Search Publications by: Thomas A. Germer (Fed)

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Displaying 26 - 50 of 385

Uncertainty in global downwelling plane irradiance estimates from sintered polytetra fluoroethylene plaque radiance measurements

May 20, 2019
Author(s)
Alexandre Castagna, B. Carol Johnson, Kenneth Voss, Heidi M. Dierssen, Heather Patrick, Thomas Germer, Zhehai Shang
Global downwelling plane irradiance is a necessary variable to normalize the water-leaving radiance measurements, reducing the magnitude and spectral variabilities introduced by the incident light field. As a result, the normalized measurements, known as

Structured Illumination Mueller Matrix Imaging

May 16, 2019
Author(s)
Joseph P. Angelo, Thomas Germer, Maritoni Litorja
We perform Mueller matrix imaging (MMI) of diffusely scattering phantoms under sinusoidal irradiance of varying spatial frequency. Quantitative polarimetric sensing via MMI completely characterizes a sample's polarimetric properties, while structured

Imaging linear and circular polarization features in leaves with complete Mueller matrix polarimetry

June 1, 2018
Author(s)
C.H. L. Patty, David Luo, Frans Snik, Freek Ariese, Wybren J. Buma, Inge L. ten Kate, Rob J. van Spanning, William Sparks, Thomas Germer, Gy?z? Garab, Michael W. Kudenov
Spectropolarimetry of intact plant leaves allows to probe the molecular architecture of vegetation photosynthesis in a non-invasive and non-destructive way and, as such, can offer a wealth of physiological information. In addition to the molecular signals

Waveguide coupling via magnetic gratings with effective strips

April 14, 2018
Author(s)
Kevin Roccapriore, David Lyvers, Dean Brown, Ekaterina Poutrina, Augustine Urbas, Thomas Germer, Vladimir Drachev
Gratings with complex multilayer strips are studied under inclined incident light. Great interest in these gratings is due to applications as input/output tools for waveguides and as subwavelength metafilms. The structured strips introduce anisotropy in

Modeling the polarized X-ray scattering from periodic nanostructures with molecular anisotropy

December 1, 2017
Author(s)
Christopher D. Liman, Thomas A. Germer, Daniel F. Sunday, Dean M. DeLongchamp, Regis J. Kline
We discuss a new technique to measure molecular orientation in nanostructures using resonant soft X-rays. This technique is based on a variable angle transmission measurement called critical dimension X-ray scattering that enables the characterization of

Plasma nanotexturing of silicon surfaces for photovoltaics applications: Influence of initial surface finish on the evolution of topographical and optical properties

November 27, 2017
Author(s)
Guillaume Fischer, Etienne Drahi, Martin Foldyna, Thomas Germer, Erik V. Johnson
Using a plasma to generate a surface texture with feature sizes on the order of nanometers ("nanotexturing") is a promising technique being considered for application in thin, high- efficiency crystalline silicon solar cells. This study investigates the

Modeling, Measurement, and Standards for Wafer Inspection

February 19, 2017
Author(s)
George Mulholland, Thomas A. Germer, J C. Stover
The major technical issues regarding the calibration of Surface Scanning Inspection Systems (SSIS) are presented including descriptions of the salient features of SSISs and the deposition system using the differential mobility analyzer. The role of the

Scattered Light Analysis of Birefringent Coatings for Distributed Polarization Rotators

October 20, 2016
Author(s)
Katelynn A. Sharma, Thomas Germer, Christopher Smith, Jonathan Zuegel, James B. Oliver, Thomas G. Brown
We characterize scattered light in polarization optics designed to maintain uniform illumination on target during spherical direct drive fusion experiments. An optical scatter instrument is used to measure the scatter distribution in the forward and